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Controlled Molecular Orientation through Intercalation in PVDF Thin Films: Exhibiting Ultralong Retention and Improved Leakage Current
Langmuir ( IF 3.9 ) Pub Date : 2024-04-10 , DOI: 10.1021/acs.langmuir.3c03868
Pinki Malik 1 , Sudip Naskar 1 , Dipanjan Sengupta 1 , Dipankar Mandal 1
Affiliation  

Ferroelectric switching and retention performance of poly(vinylidene fluoride) (PVDF) thin films improve by the incorporation of unmodified smectite montmorillonite (MMT) clay nanodielectric. In the present study, an intercalated PVDF (clay/PVDF) thin film with edge-on β-crystallite is fabricated via a heat-controlled spin coating (HCSC) technique. This provides an efficient and simple way to fabricate the edge-on oriented crystallite lamellae with an electroactive β-phase, facilitating nanoscale ferroelectric switching at a lower voltage compared to the face-on orientation. Here, we demonstrate the polarization retention for periods longer than 20 days (∼480 h, i.e., 1.8 × 106 s), with no degradation in switched nanoscale domains. In addition, by maintaining the relatively high dielectric constant, the incorporation of nanoclay effectively lowers the leakage current by 102 factors. The obtained memory window in the edge-on orientation is 7 V, approximately twice the memory window obtained in the face-on orientation. In short, our findings provide a simple and promising route to fabricate edge-on oriented PVDF thin films, with ultralong retention, high dielectric constant, and improved leakage current.

中文翻译:

通过 PVDF 薄膜中的插层控制分子取向:表现出超长保留和改进的漏电流

通过掺入未改性的蒙脱石 (MMT) 粘土纳米电介质,聚偏二氟乙烯 (PVDF) 薄膜的铁电开关和保留性能得到改善。在本研究中,通过热控旋涂(HCSC)技术制备了带有边缘β微晶的插层PVDF(粘土/PVDF)薄膜。这提供了一种高效且简单的方法来制造具有电活性β相的边缘取向微晶片层,与正面取向相比,有利于在较低电压下实现纳米级铁电开关。在这里,我们展示了超过 20 天(∼480 小时,即 1.8 × 10 6 s)的偏振保持,并且切换纳米级域没有退化。此外,通过保持相对较高的介电常数,纳米粘土的掺入有效地将漏电流降低了10 2倍。在侧向方向上获得的存储窗口为 7 V,大约是在正面方向上获得的存储窗口的两倍。简而言之,我们的研究结果提供了一种简单且有前途的方法来制造边缘取向的 PVDF 薄膜,该薄膜具有超长的保留时间、高介电常数和改善的漏电流。
更新日期:2024-04-10
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