For the prediction of electromagnetic (EM) coupling in a complex (wave-chaotic) enclosure, the random coupling model (RCM) has proven useful. The applicability of RCM has been demonstrated using various complex enclosures, but their reported validations are mostly with the input and output ports placed within the enclosure. However, since many practical scenarios consist of EM coupling through an aperture of the enclosure from external sources, an extension of the RCM to accommodate such scenarios would be of interest. In this article, we present an extended RCM approach that provides an effective statistical prediction of EM coupling in a complex enclosure for an aperture excitation scenario. Here, we treat the entire wave propagation paths as a cascaded system of two-port networks with an analysis of the aperture using the transmission line theory. This allows us to accurately extract the cavity-specific loss parameter which is required for the RCM prediction of EM coupling, even for an aperture excitation scenario. The overall experimental results suggest that the statistics of the voltages induced on the target port inside the cavity are accurately predictable even in the case of aperture excitation.

中文翻译：

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使用扩展随机耦合模型预测通过孔径进行外部激励的复杂外壳中的电磁耦合

对于预测复杂（波混沌）外壳中的电磁 (EM) 耦合，随机耦合模型 (RCM) 已被证明是有用的。 RCM 的适用性已通过各种复杂的外壳得到证明，但其报告的验证主要是将输入和输出端口放置在外壳内。然而，由于许多实际场景包括通过外壳孔径从外部源进行电磁耦合，因此 RCM 的扩展以适应此类场景将引起人们的兴趣。在本文中，我们提出了一种扩展的 RCM 方法，该方法可以为孔径激励场景的复杂外壳中的电磁耦合提供有效的统计预测。在这里，我们将整个波传播路径视为两端口网络的级联系统，并使用传输线理论对孔径进行分析。这使我们能够准确提取电磁耦合 RCM 预测所需的腔特定损耗参数，即使对于孔径激励场景也是如此。总体实验结果表明，即使在孔径激励的情况下，腔内目标端口上感应的电压的统计数据也是可以准确预测的。