In this work, electrical tree inception and ageing experiments were conducted to investigate the initiation, growth characteristics and structural characteristics of electrical trees of nano-SiO₂ doped epoxy resin at different temperatures. Electrical tree inception and ageing experiments were conducted using power frequency voltage of 15 kV at 20, 40, 60, 80 and 100°C. Electrical breakdown properties of epoxy resin were investigated by applying AC and DC voltages at 20, 40, 80 and 120°C. There are two major observations based on the experimental results. With the increase of temperature, the morphological structure of the electrical trees changes from dendritic to plexiform, the tree inception voltage decreases and the growth rate of the electrical trees increases obviously. Either under DC or AC voltage, the breakdown strength of the nano-SiO₂ doped epoxy resin decreases as the temperature increases. Finally, based on the space charge and the trap level measurement, the mechanism of the electrical tree propagation and breakdown in nano-SiO₂ doped epoxy resin was analysed.

中文翻译：

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纳米SiO2掺杂环氧树脂高温下电树现象的缓解

本工作通过电树的起始和老化实验来研究纳米SiO _{2电树的引发、生长特征和结构特征}不同温度下的掺杂环氧树脂。在20、40、60、80和100℃下使用15 kV工频电压进行电树启动和老化实验。通过在 20、40、80 和 120°C 下施加交流和直流电压来研究环氧树脂的电击穿性能。基于实验结果有两个主要观察结果。随着温度的升高，电树的形态结构由树枝状转变为丛状，树起始电压降低，电树的生长速率明显增加。无论在直流还是交流电压下，纳米SiO _{2的击穿强度}环氧树脂的掺杂量随温度升高而降低。_{最后，基于空间电荷和陷阱能级测量，分析了纳米SiO 2}掺杂环氧树脂中电树传播和击穿的机理。