In this review, we introduce the operating principle of photoinduced force microscopy (PiFM) and its applications. First, we introduce that the photoinduced force includes the gradient force and the scattering force. Next, we explain how to eliminate the effects of photothermal effects on the metal tip and sample surface caused by light irradiation. Then, we introduce a PiFM operating in air based on the tapping mode and present images of SiNc clusters. Furthermore, we introduce a PiFM operating in vacuum based on the frequency modulation (FM) mode, and present the results of three-dimensional photo-induced force vector measurements of semiconductor quantum dots.

在这篇综述中，我们介绍了光诱导力显微镜 (PiFM) 的工作原理及其应用。首先，我们介绍光致力包括梯度力和散射力。接下来，我们解释如何消除光照射对金属尖端和样品表面的光热效应的影响。然后，我们介绍了一种基于轻敲模式在空气中运行的 PiFM，并展示了 SiNc 簇的图像。此外，我们介绍了基于频率调制 (FM) 模式在真空中运行的 PiFM，并展示了半导体量子点的三维光致力矢量测量结果。