We established a system for simultaneous measurements of photoelectrochemical (PEC) reaction and photoabsorption in a semiconductor photoelectrode. This system uses a photoacoustic technique and photoelectrodes with a film-thickness gradient that was prepared by electrophoretic deposition of tungsten(VI) oxide particles while pulling up a substrate. The system enabled high-throughput determination of optimum film thickness, and the results showed that irradiation direction has a significant influence on PEC performance for a photoelectrode with a thick film. Furthermore, the mechanism of enhancement of PEC performance by postnecking treatment was discussed.

中文翻译：

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用于半导体光电极厚度优化的光吸收和光电化学性能的同时测量

我们建立了一个系统，用于同时测量半导体光电极中的光电化学 (PEC) 反应和光吸收。该系统使用光声技术和具有薄膜厚度梯度的光电极，通过在拉起基板的同时电泳沉积氧化钨 (VI) 颗粒制备。该系统能够高通量确定最佳膜厚，结果表明，照射方向对厚膜光电极的 PEC 性能有显着影响。此外，还讨论了颈后处理增强PEC性能的机制。