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Electric transport and enhanced dielectric permittivity in pure and Al doped NiO nanostructures
Journal of Alloys and Compounds ( IF 5.8 ) Pub Date : 2018-02-01 , DOI: 10.1016/j.jallcom.2017.11.114
M. Naseem Siddique , Ateeq Ahmed , P. Tripathi

Abstract In this paper, we have studied the electrical and transport properties of Ni1-xAlxO(x = 0.00, 0.01, 0.03, 0.05) nanoparticles which have been synthesized through wet chemical route via a sol-gel method at 600 °C. The XRD patterns reveal that the NiO nanoparticles have a cubic polycrystalline crystal structure with average crystallite size ranging from 18.20 nm to 9.54 nm and 17.20 nm to 11.53 nm which are calculated by Debye-Sherrer and William Hall method, respectively. The morphology and size of the nanoparticles have also been observed by Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for pure and Al-doped (5%) NiO nanoparticles. We have also studied the DC resistivity and activation energy (0.19 eV-0.49 eV) of our samples using two probe measurement. It is observed that pure and Al-doped NiO nanoparticles exhibit a giant value of dielectric permittivity (103-104). The high value of dielectric constant of Al-doped NiO nanoparticles depends on Al concentration and can be ascribed to the thermally activated and Maxwell–Wagner polarization mechanism.

中文翻译:

纯和掺杂 Al 的 NiO 纳米结构中的电传输和增强的介电常数

摘要 在本文中,我们研究了 Ni1-xAlxO(x = 0.00, 0.01, 0.03, 0.05) 纳米粒子的电学和输运性质,这些纳米粒子是通过湿化学途径通过溶胶-凝胶法在 600 °C 下合成的。XRD图谱显示NiO纳米颗粒具有立方多晶结构,平均晶粒尺寸范围为18.20 nm至9.54 nm和17.20 nm至11.53 nm,分别通过Debye-Sherrer和William Hall方法计算。通过扫描电子显微镜 (SEM) 和透射电子显微镜 (TEM) 还观察了纳米颗粒的形态和尺寸,用于纯和铝掺杂 (5%) 氧化镍纳米颗粒。我们还使用两个探针测量研究了样品的直流电阻率和活化能 (0.19 eV-0.49 eV)。据观察,纯的和掺铝的 NiO 纳米颗粒表现出巨大的介电常数值 (103-104)。Al 掺杂的 NiO 纳米粒子的高介电常数值取决于 Al 浓度,可以归因于热激活和 Maxwell-Wagner 极化机制。
更新日期:2018-02-01
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