Atomic force microscopy has enabled imaging at the sub-molecular level, and 3D mapping of the tip-surface potential field. However, fast identification of the surface still remains a challenging topic for the microscope to enjoy widespread use as a tool with chemical contrast. In this paper, as a step towards implementation of such function, we introduce a control scheme and mathematical treatment of the acquired data that enable retrieval of essential information characterizing this potential field, leading to fast acquisition of images with chemical contrast. The control scheme is based on the tip sample distance modulation at an angular frequency ω , and null-control of the ω component of the measured self-excitation frequency of the oscillator. It is demonstrated that this control is robust, and that effective Morse Parameters that give satisfactory curve fit to the measured frequency shift can be calculated at rates comparable to the scan. Atomic features with similar topography were distinguished by...

中文翻译：

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彩色原子力显微镜：一种获取三个独立势参数以生成彩色图像的方法

原子力显微镜使亚分子水平的成像和尖端表面势场的 3D 映射成为可能。然而，表面的快速识别仍然是显微镜作为具有化学对比的工具广泛使用的一个具有挑战性的课题。在本文中，作为实现此类功能的一个步骤，我们引入了对所获取数据的控制方案和数学处理，从而能够检索表征该势场的基本信息，从而快速获取具有化学对比度的图像。控制方案基于角频率 ω 下的尖端采样距离调制，以及测量的振荡器自激频率的 ω 分量的零控制。证明这种控制是稳健的，并且可以以与扫描相当的速率计算对测量的频移给出令人满意的曲线拟合的有效莫尔斯参数。具有相似地形的原子特征通过...