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Optical and Optoelectronic Property Analysis of Nanomaterials inside Transmission Electron Microscope
Small ( IF 13.3 ) Pub Date : 2017-09-13 , DOI: 10.1002/smll.201701564
Joseph F. S. Fernando 1 , Chao Zhang 1 , Konstantin L. Firestein 1, 2 , Dmitri Golberg 1, 3
Affiliation  

In situ transmission electron microscopy (TEM) allows one to investigate nanostructures at high spatial resolution in response to external stimuli, such as heat, electrical current, mechanical force and light. This review exclusively focuses on the optical, optoelectronic and photocatalytic studies inside TEM. With the development of TEMs and specialized TEM holders that include in situ illumination and light collection optics, it is possible to perform optical spectroscopies and diverse optoelectronic experiments inside TEM with simultaneous high resolution imaging of nanostructures. Optical TEM holders combining the capability of a scanning tunneling microscopy probe have enabled nanomaterial bending/stretching and electrical measurements in tandem with illumination. Hence, deep insights into the optoelectronic property versus true structure and its dynamics could be established at the nanometer‐range precision thus evaluating the suitability of a nanostructure for advanced light driven technologies. This report highlights systems for in situ illumination of TEM samples and recent research work based on the relevant methods, including nanomaterial cathodoluminescence, photoluminescence, photocatalysis, photodeposition, photoconductivity and piezophototronics.

中文翻译:

透射电子显微镜内纳米材料的光学和光电性能分析

原位透射电子显微镜(TEM)允许人们响应外部刺激(例如热量,电流,机械力和光),以高空间分辨率研究纳米结构。这篇评论专门针对TEM内部的光学,光电和光催化研究。随着TEM的发展以及包括原位照明和聚光光学器件的专用TEM支架,可以在TEM内部进行光学光谱学和各种光电实验,同时对纳米结构进行高分辨率成像。光学TEM支架结合了扫描隧道显微镜探针的功能,使得纳米材料的弯曲/拉伸和电学测量与照明相结合。因此,可以以纳米范围的精度建立对光电子性质与真实结构及其动力学的深入了解,从而评估纳米结构对先进的光驱动技术的适用性。该报告重点介绍了用于TEM样品的原位照明系统以及基于相关方法的最新研究工作,包括纳米材料的阴极发光,光致发光,光催化,光沉积,光电导和压电电子学。
更新日期:2017-09-13
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