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Effects of H2O- and O2-containing He carrier gases on 206Pb/238U system bias and down-hole fractionation in LA-ICPMS of zircons
Journal of Analytical Atomic Spectrometry ( IF 3.1 ) Pub Date : 2017-09-06 00:00:00 , DOI: 10.1039/c7ja00017k
Steffen Allner 1, 2, 3, 4 , Joachim Koch 1, 2, 3, 4 , Simon E. Jackson 5, 6, 7 , Detlef Günther 1, 2, 3, 4
Affiliation  

This paper is dealing with the effects the addition of H2O or O2 to He aerosol carrier gas has on 206Pb/238U ratios during laser ablation inductively-coupled plasma mass spectrometry (LA-ICPMS) of natural zircons and synthetic silicate glass. The following parameters were studied: (i) system bias defined as constant but LA-ICPMS system-dependent shifts in 206Pb/238U ratios, (ii) down-hole fractionation given by the slope of 206Pb/238U ratio vs. LA time, and (iii) the sum of (i) and (ii) referred to as overall elemental fractionation. To isolate and study changes of 206Pb/238U ratios arising independently from either LA sampling or ICPMS analysis of the generated aerosols, a diffusion-based gas exchange device was used. The supply of He + O2 caused relative changes in mean 206Pb/238U values and temporal gradients due to the LA process of less than 40 %. By contrast, addition of H2O to the He carrier gas changed 206Pb/238U ratios by up to 150 % through processes occurring during LA sampling as well as ICPMS analysis. Here, opposing temporal gradients of 206Pb/238U ratios canceled out at relative humidity levels close to the ambient saturation vapor pressure. As a consequence, changes in 206Pb/238U ratios caused by down-hole fractionation could be suppressed. However, the admixture of H2O also affected the system bias at the same time, resulting in increased offsets in 206Pb/238U ratios such that the accuracy of LA-ICPMS analyses worsened by up to 6 % when applied to the age determination of zircons. Neither worsening nor significant improvements in the accuracy of 206Pb/238U-based ages were observed in the case of LA-ICPMS using He + O2 carrier gas mixtures.

中文翻译:

含H 2 O和O 2的He载气对锆石LA-ICPMS中206 Pb / 238 U系统偏压和井下分离的影响

本文研究了在天然锆石和合成硅酸盐玻璃的激光烧蚀电感耦合等离子体质谱法(LA-ICPMS)中,向He气溶胶载气中添加H 2 O或O 2206 Pb / 238 U比的影响。研究了以下参数:(i)系统偏差定义为206 Pb / 238 U比值恒定但与LA-ICPMS相关的系统偏移;(ii)206 Pb / 238 U比值的斜率vs. LA时间,以及(iii)(i)和(ii)之和称为总元素分级。分离和研究206 Pb / 238的变化U比率独立于产生的气溶胶的LA采样或ICPMS分析而产生,使用了基于扩散的气体交换装置。He + O 2的供给由于LA过程小于40%,导致平均206 Pb / 238 U值和时间梯度的相对变化。相比之下,通过在LA采样以及ICPMS分析中发生的过程,向He载气中添加H 2 O最多可将206 Pb / 238 U比值改变150%。在此,相对湿度为206 Pb / 238 U的相对时间梯度在接近环境饱和蒸汽压的相对湿度下被抵消。结果是206的变化井下分级所引起的Pb / 238 U比可以得到抑制。但是,H 2 O的混合物也同时影响了系统偏差,导致206 Pb / 238 U比值的偏移增加,因此,将LA-ICPMS分析的准确性应用于年龄确定时,恶化了多达6%。的锆石。在使用He + O 2载气混合物的LA-ICPMS的情况下,未观察到206 Pb / 238 U基年龄的准确性恶化或明显改善。
更新日期:2017-09-07
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