Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy,Accounts of Chemical Research

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Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy
Accounts of Chemical Research ( IF 16.4 ) Pub Date : 2017-07-05 00:00:00 , DOI: 10.1021/acs.accounts.7b00123
Naoya Shibata _{1,

2} , Scott D. Findlay ₃ , Takao Matsumoto ₁ , Yuji Kohno ₄ , Takehito Seki ₁ , Gabriel Sánchez-Santolino _{1,

5} , Yuichi Ikuhara _{1,

2}

Affiliation

The functional properties of materials and devices are critically determined by the electromagnetic field structures formed inside them, especially at nanointerface and surface regions, because such structures are strongly associated with the dynamics of electrons, holes and ions. To understand the fundamental origin of many exotic properties in modern materials and devices, it is essential to directly characterize local electromagnetic field structures at such defect regions, even down to atomic dimensions. In recent years, rapid progress in the development of high-speed area detectors for aberration-corrected scanning transmission electron microscopy (STEM) with sub-angstrom spatial resolution has opened new possibilities to directly image such electromagnetic field structures at very high-resolution.

中文翻译：

通过扫描透射电子显微镜直接可视化局部电磁场结构

材料和设备的功能特性取决于它们内部形成的电磁场结构，特别是在纳米界面和表面区域，因为这些结构与电子，空穴和离子的动力学密切相关。为了了解现代材料和设备中许多奇异特性的基本起源，直接表征此类缺陷区域甚至是原子尺寸的局部电磁场结构至关重要。近年来，用于具有亚埃空间分辨率的像差校正扫描透射电子显微镜（STEM）的高速区域检测器的开发迅速发展，为以非常高分辨率直接成像这种电磁场结构开辟了新的可能性。

更新日期：2017-07-05

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