Editor-in-Chief Christiane Maierhofer, Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, Germany
Editors Gennaro Cardone, University of Naples, Italy André Chrysochoos, University of Montpellier, France Gerd Dobmann, Saar-University, Saarbrücken, Germany Jean Dumoulin, IFSTTAR, Champs-sur-Marne, Ile-de-France, France Mariusz Kaczmarek, Gdansk University of Technology, Poland Rainer Krankenhagen, Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, Germany Jean-Claude Krapez, Onera, Salon de Provence, France Guohua Li, China Univ. of Mining & Technology, Beijing, China Xavier Maldague, University Laval, Quebec (Quebec), Canada Antoni Nowakowski, Gdansk University of Technology, Poland Beate Oswald-Tranta, University of Leoben, Austria Hernán Darío Benítez Restrepo, Pontificia Universidad Javeriana, Cali, Colombia Stefano Sfarra, University of L'Aquila, Italy Suneet Tuli, Indian Institute of Technology, New-Delhi, India Vladimir Vavilov, Tomsk Polytechnic University, Tomsk, Russia
Editors Emeritus Daniel Balageas, Institute of Mechanics and Engineering, Bordeaux, France Gerd Busse, University of Stuttgart, Germany Giovanni Carlomagno, University of Naples, Italy
Scientific Advisory Board Jean-Christophe Batsale, Institute of Mechanics and Engineering, Bordeaux, France Abdelhakim Bendada, University Laval, Quebec (Quebec), Canada Paolo Bison, CNR-ITC, Padova, Italy Jean-Marie Buchlin, Von Karman Institute, Rhode-Saint-Genèse, Belgium Carosena Meola, University of Naples Federico II, Naples, Italy Hervé Pron, University of Reims, France Agustín Salazar, University of the Basque Country, Bilbao, Spain Ferry Schrijer, Delft University of Technology, Netherlands Steven Shepard, Thermal Wave Imaging, Inc., Ferndale, MI, USA Srecko Svaic, University of Zagreb, Croatia Boguslav Wiecek, University of Lodz, Poland
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