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Quantitative InfraRed Thermography Journal
基本信息
期刊名称 Quantitative InfraRed Thermography Journal
QUANT INFR THERM J
期刊ISSN 1768-6733
期刊官方网站 http://www.tandfonline.com/toc/tqrt20/current
是否OA
出版商 Taylor and Francis Ltd.
出版周期
始发年份
年文章数 19
最新影响因子 2.5(2022)  scijournal影响因子  greensci影响因子
中科院SCI期刊分区
大类学科 小类学科 Top 综述
工程技术4区 INSTRUMENTS & INSTRUMENTATION 仪器仪表4区
MATERIALS SCIENCE, CHARACTERIZATION & TESTING 材料科学:表征与测试4区
PHYSICS, APPLIED 物理:应用4区
CiteScore
CiteScore排名 CiteScore SJR SNIP
学科 排名 百分位 1.57 0.357 1.054
补充信息
自引率 9.30%
H-index 10
SCI收录状况 Science Citation Index Expanded
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PubMed Central (PML) http://www.ncbi.nlm.nih.gov/nlmcatalog?term=1768-6733%5BISSN%5D
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The Quantitative InfraRed Thermography Journal (QIRT) provides a forum for industry and academia to discuss the latest developments of instrumentation, theoretical and experimental practices, data reduction, and image processing related to infrared thermography.

We welcome papers that explore:

  • State-of-the-art and evolution in the field of infrared scanners and imaging systems allowing quantitative measurements, and related data acquisition and storing systems.
  • Calibration and characterization of infrared cameras and related problems like certification, standardization, emissivity determination, absorption in media, spurious radiations, three dimensionality of observed objects.
  • Data reduction and image processing related to infrared thermography.
  • Application of infrared thermography to radiometry, thermometry, and physical parameters identification that cover fluid mechanics, solid mechanics, structures and material sciences, non-destructive evaluations, electromagnetism, medicine and biomedical science, remote sensing, environment, and industrial processes.
  • Concurrent thermographic techniques when they present comparative evaluations including infrared thermography.



All submitted manuscripts are subject to initial appraisal by the Editor, and, if found suitable for further consideration, to peer review by independent, anonymous expert referees. All peer review is single blind. For more information on submitting visit our Instructions for Authors page.


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Editor-in-Chief 
Christiane Maierhofer, Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, Germany 

Editors 
Gennaro Cardone, University of Naples, Italy 
André Chrysochoos, University of Montpellier, France 
Gerd Dobmann, Saar-University, Saarbrücken, Germany 
Jean Dumoulin, IFSTTAR, Champs-sur-Marne, Ile-de-France, France 
Mariusz Kaczmarek, Gdansk University of Technology, Poland 
Rainer Krankenhagen, Bundesanstalt für Materialforschung und -prüfung (BAM), Berlin, Germany 
Jean-Claude Krapez, Onera, Salon de Provence, France 
Guohua Li, China Univ. of Mining & Technology, Beijing, China 
Xavier Maldague, University Laval, Quebec (Quebec), Canada 
Antoni Nowakowski, Gdansk University of Technology, Poland 
Beate Oswald-Tranta, University of Leoben, Austria 
Hernán Darío Benítez Restrepo, Pontificia Universidad Javeriana, Cali, Colombia 
Stefano Sfarra, University of L'Aquila, Italy 
Suneet Tuli, Indian Institute of Technology, New-Delhi, India 
Vladimir Vavilov, Tomsk Polytechnic University, Tomsk, Russia 

Editors Emeritus 
Daniel Balageas, Institute of Mechanics and Engineering, Bordeaux, France 
Gerd Busse, University of Stuttgart, Germany 
Giovanni Carlomagno, University of Naples, Italy 

Scientific Advisory Board
 
Jean-Christophe Batsale, Institute of Mechanics and Engineering, Bordeaux, France 
Abdelhakim Bendada, University Laval, Quebec (Quebec), Canada 
Paolo Bison, CNR-ITC, Padova, Italy 
Jean-Marie Buchlin, Von Karman Institute, Rhode-Saint-Genèse, Belgium 
Carosena Meola, University of Naples Federico II, Naples, Italy 
Hervé Pron, University of Reims, France 
Agustín Salazar, University of the Basque Country, Bilbao, Spain 
Ferry Schrijer, Delft University of Technology, Netherlands 
Steven Shepard, Thermal Wave Imaging, Inc., Ferndale, MI, USA 
Srecko Svaic, University of Zagreb, Croatia 
Boguslav Wiecek, University of Lodz, Poland

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