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PATTERN ANALYSIS AND APPLICATIONS
基本信息
期刊名称 PATTERN ANALYSIS AND APPLICATIONS
PATTERN ANAL APPL
期刊ISSN 1433-7541
期刊官方网站 http://www.springer.com/computer/image+processing/journal/10044
是否OA
出版商 Springer London
出版周期 Quarterly
始发年份 1998
年文章数 79
最新影响因子 3.9(2022)  scijournal影响因子  greensci影响因子
中科院SCI期刊分区
大类学科 小类学科 Top 综述
工程技术4区 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE 计算机:人工智能4区
CiteScore
CiteScore排名 CiteScore SJR SNIP
学科 排名 百分位 1.78 0.358 1.046
Computer Science
Computer Vision and Pattern Recognition
34 / 75 55%
Computer Science
Artificial Intelligence
85 / 189 55%
补充信息
自引率 5.20%
H-index 43
SCI收录状况 Science Citation Index Expanded
官方审稿时间
Submission to first decision
136 days
网友分享审稿时间 数据统计中,敬请期待。
PubMed Central (PML) http://www.ncbi.nlm.nih.gov/nlmcatalog?term=1433-7541%5BISSN%5D
投稿指南
期刊投稿网址 https://www.editorialmanager.com/paaa/
收稿范围

The journal publishes high quality articles in areas of fundamental research in intelligent pattern analysis and applications in computer science and engineering. It aims to provide a forum for original research which describes novel pattern analysis techniques and industrial applications of the current technology. In addition, the journal will also publish articles on pattern analysis applications in medical imaging. The journal solicits articles that detail new technology and methods for pattern recognition and analysis in applied domains including, but not limited to, computer vision and image processing, speech analysis, robotics, multimedia, document analysis, character recognition, knowledge engineering for pattern recognition, fractal analysis, and intelligent control. The journal publishes articles on the use of advanced pattern recognition and analysis methods including statistical techniques, neural networks, genetic algorithms, fuzzy pattern recognition, machine learning, and hardware implementations which are either relevant to the development of pattern analysis as a research area or detail novel pattern analysis applications. Papers proposing new classifier systems or their development, pattern analysis systems for real-time applications, fuzzy and temporal pattern recognition and uncertainty management in applied pattern recognition are particularly solicited.

The journal encourages the submission of original case-studies on applied pattern recognition which describe important research in the area. The journal also solicits reviews on novel pattern analysis benchmarks, evaluation of pattern analysis tools, and important research activities at international centres of excellence working in pattern analysis.

For all submission-related enquiries, please contact the Journal Editorial Office via “Contacts” or the Senior Editor Dragos Calitoiu at calitoiu@math.carleton.ca.


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编辑信息

EDITORS 

Editor-in-Chief 
SAMEER SINGH
Rail Vision, Castle Donington, UK 

For all submission-related enquiries, please contact the Journal Editorial Office via “Contacts” or the Senior Editor Dragos Calitoiu at calitoiu@math.carleton.ca.

Senior Editor
DRAGOS CALITOIU
School of Mathematics and Statistics, Carleton University, Canada 
calitoiu@math.carleton.ca

Book Reviews Editor 
DAVID G. STORK
 
Rambus Labs, 1050 Enterprise Way, Suite 700, Sunnyvale, CA 94089 USA
stork@rsv.ricoh.com

ASSOCIATE EDITORS

MAYER ALADJEM
Ben-Gurion University of the Negev
aladjem@ee.bgu.ac.il

FELIX ALBU
Valahia University of Targoviste, Romania
felix.albu@valahia.ro 

GEORGE BEBIS
University of Nevada Reno, USA
bebis@cse.unr.edu

ALBERTO DEL BIMBO
 
University of Florence, Italy
delbimbo@dsi.unifi.it

DAVID S Y CHO
University of Nottingham Ningbo, China
David.CHO@nottingham.edu.cn

CARLOS A COELLO COELLO
Cinvestav IPN, Mexico
ccoello@cs.cinvestav.mx

ERIK CUEVAS
University of Guadalajara, Mexico
erik.cuevas@cucei.udg.mx

JOHAN DEBAYLE
Ecole Nationale Supérieure des Mines de Saint-Etienne, France
debayle@emse.fr 

J. SALVADOR SÁNCHEZ GARRETA 
Universitat Jaume I, Spain
salvador.sanchez@lsi.uji.es

XUELONG LI
Northwestern Polytechnical University, China
xuelong_li@opt.ac.cn

MAJID MIRMEHDI
University of Bristol, UK
majid@cs.bris.ac.uk

JOHAN DEBAYLE
Ecole Nationale Supérieure des Mines de Saint-Etienne, France
debayle@emse.fr 

J. SALVADOR SÁNCHEZ GARRETA 
Universitat Jaume I, Spain
salvador.sanchez@lsi.uji.es

XUELONG LI
Northwestern Polytechnical University, China
xuelong_li@opt.ac.cn

MAJID MIRMEHDI
University of Bristol, UK
majid@cs.bris.ac.uk

VITTORIO MURINO
PAVIS, Istituto Italiano di Tecnologia, Italy
vittorio.murino@iit.it

JEAN-CHRISTOPHE NEBEL
Kingston University, London, UK
J.Nebel@kingston.ac.uk

JAVIER ORTEGA-GARCIA
Universidad Autonoma de Madrid (UAM), Spain
javier.ortega@uam.es

SEIICHI OZAWA 
Kobe University, Japan
ozawasei@kobe-u.ac.jp

GONZALO PAJARES
University Complutense of Madrid, Spain
pajares@ucm.es

FILIBERTO PLA
University Juame I, Spain
Filiberto.Pla@lsi.uji.es

ASHOK SAMAL
University of Nebraska-Lincoln, USA
samal@cse.unl.edu

ARCOT SOWMYA
University of New South Wales, Australia
a.sowmya@unsw.edu.au

JINHUI TANG
Nanjing University of Science and Technology, China
email: jinhuitang@mail.njust.edu.cn 

JÖRG VELTEN
Bergische Universität Wuppertal, Germany
velten@uni-wuppertal.de

ANIS YAZIDI
Oslo and Akershus University College of Applied Sciences, Norway
Anis.Yazidi@hioa.no 

DANIELA ZAHARIE 
West University of Timisoara, Romania 
dzaharie@info.uvt.ro 

HAIJUN ZHANG
Harbin Institute of Technology, P.R. China
hjzhang@hit.edu.cn

ZHAO ZHANG
Soochow University, P. R. China
cszzhang@gmail.com


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