Editor-in-Chief:
Norbert Meyendorf
University of Dayton
Dayton, OH, USA
Advisory Board:
Jan D. Achenbach
Northwestern University
Evanston, IL, USA
Leonard J. Bond
Iowa State University
Ames, IA, USA
Peter Cawley
Imperial College
London, UK
Sigrun Hirsekorn
Fraunhofer Institute for Non-Destructive Testing
Saarbrücken, Germany
Editorial Board:
Anthony Croxford
University of Bristol
Bristol, UK
Nico F. Declercq
Georgia Institute of Technology
Atlanta, GA, USA
Stephen D. Holland
Iowa State University
Ames, IA, USA
Bernd Koehler
Fraunhofer IKTS
Dresden, Germany
Thomas Krause
Royal Military College of Canada
Kingston, ON, Canada
Katie Matlack
The University of Illinois at Urbana-Champaign
Urbana, IL, USA
John S. Popovics
The University of Illinois at Urbana-Champaign
Urbana, IL, USA
Rainer Schneider
Beuth University of Applied Sciences Berlin
Berlin, Germany
Gongtian Shen
China Special Equipment Inspection and Research Institute (CSEI)
Beijing, China
Tadeusz Stepinski
AGH - University of Science and Technology in Krakow
Krakow, Poland
Vladimir P. Vavilov
Tomsk Polytechnic University
Tomsk, Russia
Qiwen Zhan
University of Dayton
Dayton, OH, USA
Jinying Zhu
University of Nebraska-Lincoln
Omaha, NE, USA