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CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES
基本信息
期刊名称 CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES
CRIT REV SOLID STATE
期刊ISSN 1040-8436
期刊官方网站 http://www.tandfonline.com/toc/bsms20/current
是否OA
出版商 Taylor and Francis Ltd.
出版周期 Quarterly
始发年份
年文章数 15
最新影响因子 10.8(2022)  scijournal影响因子  greensci影响因子
中科院SCI期刊分区
大类学科 小类学科 Top 综述
工程技术2区 MATERIALS SCIENCE, MULTIDISCIPLINARY 材料科学:综合2区
PHYSICS, CONDENSED MATTER 物理:凝聚态物理3区
CiteScore
CiteScore排名 CiteScore SJR SNIP
学科 排名 百分位 7.58 1.730 3.221
Chemical Engineering
General Chemical Engineering
10 / 272 96%
Chemistry
Physical and Theoretical Chemistry
11 / 160 93%
Materials Science
Electronic, Optical and Magnetic Materials
13 / 225 94%
Physics and Astronomy
Condensed Matter Physics
14 / 397 96%
Engineering
Electrical and Electronic Engineering
26 / 661 96%
补充信息
自引率 2.40%
H-index 42
SCI收录状况 Science Citation Index
Science Citation Index Expanded
官方审稿时间
网友分享审稿时间 数据统计中,敬请期待。
PubMed Central (PML) http://www.ncbi.nlm.nih.gov/nlmcatalog?term=1040-8436%5BISSN%5D
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期刊投稿网址 http://mc.manuscriptcentral.com/bsms
收稿范围

Submissions Wanted! - Critical Reviews in Solid State and Materials Sciences is currently accepting submissions of original review articles. Please click on the “Instructions for Authors” tab for details on manuscript preparations.

Covering topics in solid state materials properties, processing, and applications, Critical Reviews in Solid State and Materials Sciences brings you the latest and most important new developments and understandings. New and emerging theoretical and experimental topics are emphasized in the disciplines of condensed matter physics, physical chemistry, materials, and electrical, chemical and mechanical engineering. Cross-disciplinary engineering and science specialties are also included.

The reviews provide a critical assessment of the state-of-the-art for both experimental and theoretical studies.

Topics Include:

  • Advanced processing techniques for new materials
  • Analysis of solid composition, bonding, structure, and topography
  • Deposition techniques to form the solid state and epitaxial layers
  • Diffusion and defects in the solid state
  • Electrical, optical, magnetic, and thermal properties of new organic and inorganic materials
  • Experimental techniques for characterization of materials and materials properties
  • Interfaces in the solid state
  • Mechanical properties of low dimensional solids
  • Nanoparticle processing and properties
  • Nucleation and growth in formation of the solid state
  • Optical spectroscopy of solids
  • Physics, chemistry. and theory of the solid state
  • Processing issues in thin film microelectronic and optoelectronic semiconductor devices
  • Quantum effects
  • Solid state band structure
  • Solid state energy sources
  • Theoretical modeling of solid state dynamics

Publication office: Taylor & Francis, Inc., 530 Walnut Street, Suite 850, Philadelphia, PA 19106.


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Editor 

Dr.Wolfgang Sigmund 
University of Florida
 
Editorial Advisory Board 
 
Li-Chyong Chen - National Taiwan University 
Charles B. Duke - Xerox Innovation Group 
Joseph E. Greene - University of Illinois 
Siegfried Hofmann - Max-Planck-Institute for Metals Research 
Dr. Paul Holloway - University of Florida 
Markku Leskelä - University of Helsinki 
Peter Majewski - University of South Australia 
Gary McGuire  - International Technology Center 
DaeWon Moon  - Korea Research Institute of Standards and Science 
Buddy D. Ratner - University of Washington 
Takuo Sugano - University of Tokyo 
Jan-Eric Sundgren - Chalmers University of Technology 
Hendrik C. Swart  - University of the Free State 
Jerry M. Woodall - Yale University


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