Journal of the International Measurement Confederation (IMEKO)



Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material representing achievements in the field, whose ultimate goal is an enhancement of the state-of-the-art of subjects such as: measurement and metrology fundamentals, measurement science, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures for performance analysis of measurement systems, processes and algorithms, mathematical models for measurement-oriented purposes, and distributed measurement systems in a connected world.


Notes:
Papers including measurement results that, although important to validate any given scientific study but which offer no new insights in an area different from measurement science or technology, do not fall within the scope of this journal;
The disciplined usage of well-known metrological terms is strongly required. Authors can access information on all relevant terms such as measurement accuracy, uncertainty, the law of propagation of uncertainty and other, similar terms: these are defined in internationally approved guidelines such as the International Vocabulary of Metrology (VIM) and Guide to the Expression of Uncertainty in Measurement (GUM), which are freely available on https://www.bipm.org/en/publications/guides/;
The paper must clearly describe the measurement context in which the research was carried out by undertaking a critical review of the state-of-the-art of the relevant body of knowledge in instrumentation and measurement and by showing how the research presented advances it;
The letter accompanying the submission must describe clearly how the paper satisfies the above requirements.


Papers that focus on image processing or fault diagnosis with little or no elements of measurement science or technology will not be considered within the journal scope.

Authors please note:
The journal Measurement is receiving an increasing number of papers in the area of machine learning/neural networks and other techniques based on artificial intelligence. These submissions will be desk rejected unless they:
prove that the described research advances the state-of-the-art in measurement science and is not just an application of an available tool to known or novel problems, that is used without an appreciation of measurement-related aspects;
show that the usage of these tools is put into the correct measurement-related context and not just in the context of machine-learning/neural network applications;
contain enough information about the used tools, data, and results to allow, in principle, anyone to replicate the described results;
display the use of specific metrics to strengthen the results of research activities.


It must be recalled that Measurement is interested in publishing new methods, techniques, procedures, algorithms, and alike that show how to better measure in nature and in the world. Thus, the capability to describe metrological-related details of the proposed research represents a major difference between papers published by this journal and by other journals publishing papers on similar topics. This major difference must be evident also in papers covering applications of machine learning and soft computing techniques. Failing to adhere to these guidelines will result in a paper desk-reject decision.

Authors whose manuscripts focus on the research, development and application of the science, engineering and technology of sensors and sensor systems, are welcome to submit to the journal's open access companion title, Measurement: Sensors.

Authors whose manuscripts focus on food and nutrition measurements may also wish to submit to the journal's second open access companion title, Measurement: Food.

original research papers, reviews, letters and short communications

Editor-in-Chief
Professor Paolo Carbone
University of Perugia, Perugia, Italy
Editors
L. DeVito
University of Sannio, Italy
E. Drakakis
Imperial College London, London, United Kingdom
A. Lay-Ekuakille
University of Salento, Lecce, Italy
J. Li
University of Waterloo Department of Geography and Environmental Management, Waterloo, Ontario, Canada
D. Macii
University of Trento, Trento, Italy
A. Marconnet
Purdue University, West Lafayette, Indiana, United States
T. Sarkodie-Gyan
University of Texas at El Paso College of Engineering, El Paso, Texas, United States
S. Vanlanduit
University of Antwerp, Antwerpen, Belgium
Y. Yan
University of Kent, Canterbury, United Kingdom
Associate Editors
B. Cukurel
Technion Israel Institute of Technology, Haifa, Israel
P. Degenaar
Newcastle University, Newcastle, United Kingdom
A. Glowacz
AGH University of Science and Technology, Poland
Y. H. Hu
North China Electric Power University, Beijing, China
Yu Kong
Rochester Institute of Technology, Rochester, New York, United States
G. Krolczyk
Opole University of Technology, Poland
M. Laracca
University of Cassino and Southern Lazio, Italy
Z. Li
China University of Mining and Technology, Xuzhou, China
W. K. Ling
Guangdong University of Technology - University Town Campus, Guangzhou, China
K.I. Papadimitriou
University College London, London, United Kingdom
K. Polat
Abant Izzet Baysal University, Bolu, Turkey
P.K. Rachakonda
National Institute of Standards and Technology (NIST), Sensor Science Division, Gaithersburg, Maryland, United States
T.G. Santos
New University of Lisbon, Portugal
M. Schoukens
University of Technology Eindhoven, Eindhoven, Netherlands
R. Trouillon
French Alternative Energies and Atomic Energy Commission Electronics and Information Technology Laboratory, Grenoble, France
R. Velazquez
Panamerican University - Mexico Campus, Ciudad de Mexico, Mexico
L. Villafane
University of Illinois at Urbana-Champaign Department of Aerospace Engineering, Urbana, Illinois, United States
C. L. Xu
Southeast University, Nanjing, China
T.-H. Yi
Dalian University of Technology, Dalian, China
X. Yue
University of the West of England Bristol, United Kingdom
N. Yusa
Tohoku University, Japan
Membership of the Board
S. Bennett
National Physical Laboratory, Teddington, United Kingdom
N. Fox
National Physical Laboratory, Teddington, United Kingdom
R.Z. Morawski
Warsaw University of Technology Institute of Radioelectronics and Multimedia Technology, Warsaw, Poland
A. Wallard
National Physical Laboratory, Teddington, United Kingdom
Ex-Officio Membership of the Board
Dr. L. Borbas
Budapest University of Technology and Economics, Budapest, Hungary
Professor M. Borsic
Croatian Metrology Society, Zagreb, Croatia
Dr. I. Castanheira
National Institute of Health Doctor Ricardo Jorge, Lisboa, Portugal
Professor M. Catelani
University of Florence, Firenze, Italy
Professor D. Dallet
Community of Universities and Institutions of Aquitaine, Bordeaux, France
Professor P. Daponte
University of Sannio, Benevento, Italy
Prof. Dr. R.X. Fernandes
National Metrology Institute of Germany, Braunschweig, Germany
Professor K.T.V. Grattan
City University of London, London, United Kingdom
Professor M. Ishikawa
Japan
Dr. T. Kobata
National Institute of Advanced Industrial Science and Technology Tsukuba Center Tsukuba Central, Tsukuba, Japan
Professor Y. Koike
Tokyo Institute of Technology - Suzukakedai Campus, Yokohama, Japan
Dr. R. Kumme
National Metrology Institute of Germany, Braunschweig, Germany
Dr. R.R. Machado
National Institute of Metrology Quality and Technology, RIO DE JANEIRO, Brazil
Dr. F. Pavese
National Institute of Metrological Research, Torino, Italy
Dr. M.J. Reader-Harris
National Engineering Laboratory Ltd. (NEL), Glasgow, United Kingdom
Professor P.P.I. Regtien
The Netherlands
Dr. G. Ripper
National Institute of Metrology Quality and Technology, RIO DE JANEIRO, Brazil
Dr. M. Rosenberger
Technical University of Berlin, Berlin, Germany
Professor G.B. Rossi
eCampus University, Novedrate, Italy
Dr. M. Sega
National Institute of Metrological Research, Torino, Italy
Professor R. Summers
Loughborough University, Loughborough, United Kingdom
Professor S. Tachi
The University of Tokyo, Bunkyo-Ku, Tokyo, Japan
Professor Y. Takaya
Osaka University, Suita, Japan
Dr. Y.H. Yim
Korea Research Institute of Standards and Science
Professor B. Zagar
Johannes Kepler University Linz, Linz, Austria
Professor D. Zvizdic
University Hospital Centre Zagreb, Zagreb, Croatia
Emeritus Editor
Professor K.T.V. Grattan
City, University of London, London, United Kingdom