个人简介
冯立春，博士，副教授。2005年毕业于清华大学电子工程系获工学博士学位，物理电子学专业。同年进入首都师范大学物理系从事红外无损检测方法、技术及相关设备等方向的研究。发表期刊及会议论文20余篇。主持及承担过国家自然科学基金、科工委预研、国防973子课题等多项项目。主持及参加制定了国家标准3项，专利3项。
近期论文
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1.WeichaoXu,JinglingShen,CunlinZhang,LichunFeng,Ultrasonicinfraredthermalwavenondestructiveevaluationforcrackdetectionofseveralaerospacematerials-art.no.68350V，ProceedingsofSPIE,
2.ZhiZeng,NingTao,LichunFeng,CunlinZhang,Breakpointdetectionofheatingwireinwindblademouldsusinginfraredthermography,InfraredPhysics&Technology,Vol.64,p73-78(2014)
3.ZhiZeng,NingTao,LichunFeng,Developingsignalprocessingmethodforrecognizingdefectsinmetalsamplesbasedonheatdiffusionpropertiesinsonicinfraredimagesequences,OpticalEngineering,52(6),061309(2013)
4.GuoLi,LichunFeng,CunlinZhang,OptimizationfortheheatingpulseusedinInfraredThermographyNon-DestructiveTestingtechnology，ProceedingsofSPIE，856221(2012);
5.GuoLi,XiaoleiWang,LichunFeng,CunlinZhang,DesignandoptimizationofchopperbasedonLabview,ProceedingsofSPIE，85571V(2012)
6.ZhiZeng,NingTao,LichunFeng,CunlinZhang,Specifiedvaluebaseddefectdepthpredictionusingpulsedthermography,JournalofAppliedPhysics,112(2),023112(2012)
7.ZhiZeng,JingZhou,NingTao,LichunFeng,SupportvectormachinesbaseddefectrecognitioninSonicIRusing2Dheatdiffusionfeatures,NDT&EInternational,Vol.47,p116-123,(2012)
8.TieFeng,CunlinZhang,LichunFeng,Theeffectofdepthonthequantitativeestimationofdefectsizeusingpulsedthermography,ProceedingsofSPIE,81933B(2011)
9.LichunFeng,RuigangHe,YanZhang,Measurementofdefectdepthbypeaksecondderivativemethodinpulsethermography,ProceedingsofSPIE,819333(2011)
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