Observation of large remnant polarization in epitaxial yttrium-doped hafnium oxide thin films demonstrates that small-grained or ultrathin microstructures are not required to achieve robust ferroelectric behaviour.

中文翻译：

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铁电 HfO2 的另一种途径

在外延钇掺杂的氧化铪薄膜中观察到大的剩余极化表明不需要小晶粒或超薄微结构来实现稳健的铁电行为。