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Study of electrical attributes of molybdenum ditelluride (MoTe2) FET using experimental and theoretical evidences
Microelectronic Engineering ( IF 2.3 ) Pub Date : 2020-06-01 , DOI: 10.1016/j.mee.2020.111365
M.W. Iqbal , Faiza Firdous , Mumtaz Manzoor , Hira Ateeq , Sikander Azam , Sikandar Aftab , M.A. Kamran , Altaf ul Rehman , Abdul Majid

Abstract Two-dimensional (2D) semiconducting TMDCs materials have recently gained much attention and are considered as promising materials with a high surface-to-volume ratio for electronics. The performance of devices greatly affected by environmental factors. For attaining the high performance of the device, environmental issues must be addressed. Here, we have demonstrated an n-type doping effect from DUV + N2 treatment to overcome the environmental influences and to enhance the performance of MoTe2 FET. After the n-type doping effect from DUV + N2 treatment mobility, charge carrier density, and ION/IOFF ratio increased up to 62.4 cm2/Vs, 3 × 1012 cm−2 and 107 respectively. The negative shift of threshold voltage (Vth) and Raman peaks towards the lower wavenumber confirms the n-type doping effect in the MoTe2 FET from DUV + N2 treatment. By using this method, we can change and control the polarity of the MoTe2 FET by changing the doping time. First-principles calculation on the study of structural, electronic and optical properties have been performed using the density functional theory (DFT) where full-potential linearized augmented plane wave (FP-LAPW) was used a basis set with generalized gradient approximation plus Hubbard potential (GGA + U) respectively. Furthermore, investigation of electron charge density is done to analyze the mechanism of structural stability of nitrogen doped MoTe2. DUV + N2 treatment is an effective way to improve the performance of MoTe2 FET.

中文翻译:

使用实验和理论证据研究二碲化钼 (MoTe2) FET 的电特性

摘要 二维 (2D) 半导体 TMDCs 材料最近受到了广泛关注,被认为是具有高表面积体积比的有前途的电子材料。设备的性能受环境因素影响很大。为了获得设备的高性能,必须解决环境问题。在这里,我们展示了 DUV + N2 处理的 n 型掺杂效应,以克服环境影响并提高 MoTe2 FET 的性能。在来自 DUV + N2 处理的 n 型掺杂效应之后,电荷载流子密度和 ION/IOFF 比分别增加到 62.4 cm2/Vs、3 × 1012 cm-2 和 107。阈值电压 (Vth) 和拉曼峰值向较低波数的负移证实了来自 DUV + N2 处理的 MoTe2 FET 中的 n 型掺杂效应。通过使用这种方法,我们可以通过改变掺杂时间来改变和控制 MoTe2 FET 的极性。使用密度泛函理论 (DFT) 对结构、电子和光学特性的研究进行了第一性原理计算,其中使用全电位线性增强平面波 (FP-LAPW) 作为具有广义梯度近似加哈伯德势的基组(GGA + U) 分别。此外,还对电子电荷密度进行了研究,以分析氮掺杂 MoTe2 的结构稳定性机制。DUV + N2 处理是提高 MoTe2 FET 性能的有效途径。使用密度泛函理论 (DFT) 执行电子和光学特性,其中全电位线性增强平面波 (FP-LAPW) 分别使用广义梯度近似加上哈伯德电位 (GGA + U) 的基组。此外,还对电子电荷密度进行了研究,以分析氮掺杂 MoTe2 的结构稳定性机制。DUV + N2 处理是提高 MoTe2 FET 性能的有效途径。使用密度泛函理论 (DFT) 执行电子和光学特性,其中全电位线性增强平面波 (FP-LAPW) 分别使用广义梯度近似加上哈伯德电位 (GGA + U) 的基组。此外,还对电子电荷密度进行了研究,以分析氮掺杂 MoTe2 的结构稳定性机制。DUV + N2 处理是提高 MoTe2 FET 性能的有效途径。
更新日期:2020-06-01
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