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Wei Chen Associate Professor (Tenured) Shenzhen Technology University (SZTU)
Dr. Wei Chen, Ph.D. in Natural Sciences (Dr. rer. nat.), Tenured Associate Professor. He graduated with a Ph.D. from the Department of Physics at the Technical University of Munich (TUM) in 2020. In 2022, he joined Shenzhen Technology University as an Assistant Professor at the College of Engineering Physics, and was promoted to Tenured Associate Professor in 2024. His main research focuses on Smart Optoelectronic Integrated Systems (SOIS), Colloidal Quantum Dot Detection and Imaging Technology (QD-SWIR). To date, he has published over 40 academic papers as "First Author" and "Corresponding Author" in journals such as Nature Energy, Nature Electronics, Energy & Environmental Science, ACS Nano, and Nano Research. He has a total of over 130 academic publications, including more than 110 journal papers, with 2 papers being included in ESI as highly cited papers. He has been granted over 30 domestic and international patents. Currently, he is leading multiple research projects, including the National Natural Science Foundation of China’s Youth Fund, the Shenzhen Excellent Young Talent Project, and the Shenzhen High-end and Urgently Needed Talent Program. He serves as a reviewer for several international journals, including Advanced Materials, Applied Energy, and ACS Applied Materials & Interfaces. He has been selected for the Expert Database of the Shenzhen National High-tech Industry Innovation Center, the Shenzhen Overseas High-level Talent (Category B), the "Outstanding Applied Research Talent Development Program" mentor at Shenzhen Technology University, and the "Runyuan Youth PI" program. His research group welcomes graduate students (including visiting students) and undergraduates interested in optoelectronic materials and devices to join. (Last updated: October 2025)
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1. Smart Optoelectronic Integrated Systems (SOIS) 2. Colloidal Quantum Dots based Detection and Imaging Techniques (QD-SWIR) 3. Thinfilm Properties-Structure Correlations via Grazing-incidence X-ray scattering (GIXS: GISAXS, GIWAXS)
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