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Evaluation of fatigue limit and harmless crack size of needle peened offshore structure steel F690

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Abstract

In this study, a 0.4-1.6 mm deep semicircular crack was machined in DNV F690 offshore structural steel with an aspect ratio (As) of 1.0. After needle peening (NP), four-point bending fatigue tests were conducted. The fatigue limit estimated using the equation proposed by Ando et al. decreased with increasing crack size, but agreed with that obtained in the four-point bending fatigue test. The compressive residual stress increased the fatigue limit of the NP smooth and crack specimens. The fatigue limit of the NP crack specimen with a crack depth a = 0.8 mm was over 95 % of that of the smooth specimen. Semicircular cracks with crack depths up to a = 0.8 mm could be rendered harmless by NP, however, this was not the case for the NP crack specimen having a = 1.2 mm. It was estimated that the harmless crack depth of the NP crack specimen was a = 1.14 mm.

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Abbreviations

β :

Shape correction factor under bending stress

σ a :

Applied stress amplitude

σ r, max :

Maximum compressive residual stress

σ r, s :

Compressive residual stress at the outermost surface

Δσ w :

Fatigue limit of the non- NP smooth specimen

Δσ wc :

Fatigue limit of the cracked specimen

K r :

Stress intensity factor due to compressive residual stress

ΔK ap :

Stress intensity factor range under applied stress

ΔK ap(a) :

Stress intensity factor range based on the crack depth due to applied stress

ΔK th :

Stress intensity factor for a particular crack

ΔK th(s) :

Threshold stress intensity factor range for small cracks

ΔK th(s)A :

Threshold stress intensity factor range at the deepest point for small cracks

ΔK th(l) :

Threshold stress intensity factor range for large cracks

As :

Aspect ratio

CT :

Compact tension specimen

NP :

Needle peening

non-NP :

Non needle peened specimen

PPP :

Portable pneumatic needle-peening equipment

a :

Crack depth of a semicircular crack on a finite plate

a hlm :

Maximum harmless crack depth

c :

Half of the crack length of a semicircular crack

2c :

Crack length of the semicircular crack

d max :

Depth of maximum compressive residual stress

d 0 :

Maximum depth of compressive residual stress

2l :

Through crack length on an infinite plate

l e :

Equivalent half crack length

R :

Stress ratio

t :

Plate thickness

2w :

Plate width

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Acknowledgments

This research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (NRF-2019R1I1A3A 01059120).

The authors would like to acknowledge Mr. Yuta Kogishi, a graduate student at Yokohama National University, for his help with the measurement of residual stress.

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Correspondence to Ki-Woo Nam.

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Min-Heon Kim is a graduate student at Pukyong National University, Busan, Korea. He conducts research on the improvement of fatigue limits and on harmless cracks on metallic materials.

Won-Gu Lee is a graduate student at Pukyong National University, Busan, Korea. His research comprises the evaluation of the fatigue life and safety of offshore structures.

Cheol-Su Kim is currently working at the Eco-Friendly Transport System Research Institute, Pukyong National University, Busan, Korea. He is interested in evaluating the strengths of defects.

Koji Takahashi is working in the Division of Materials Science and Chemical Engineering, Yokohama National University, Yokohama, Japan. His research fields are metal fatigue, shot peening, self-healing materials, structural ceramics, and stress analyses.

Mitsuru Handa is working at Toyo Seiko Co. Ltd., Aiichi, Japan. He is interested in shot peening and material strength.

Ki-Woo Nam (Ph.D.) is working in the Department of Materials Science and Engineering, Pukyong National University, Busan, Korea. His research fields are crack healing and harmless cracks on structural components.

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Kim, MH., Lee, WG., Kim, CS. et al. Evaluation of fatigue limit and harmless crack size of needle peened offshore structure steel F690. J Mech Sci Technol 35, 3855–3862 (2021). https://doi.org/10.1007/s12206-021-2109-4

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  • DOI: https://doi.org/10.1007/s12206-021-2109-4

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