Abstract
This paper illustrates delta-doped Hetro-dielectric Germanium on insulator vertical tunnel field-effect transistor (DDH-GeOI VTFET) and its 2D simulations are investigated using ATLAS SILVACO TCAD tool for ultra-low power and high-performance applications. The hetro-dielectric engineering under the gate and use of low bandgap Ge material in source improves the exhibition of the device by increasing ON-state current and reducing the ambipolar current. The realization of the delta-doped layer in the Ge-source region and the use of silicon as a drain material decreases the OFF-state leakage current. The effect on the variation of the device’s physical dimensions has been carried out for different electrical parameters and the dimensions are optimized appropriately through a huge number of simulations. The parameters obtained for the proposed device are high on-state current (ION of 4.33 × 10−5 A/μm, high current ratio (ION/IOFF) of 3.77 × 1014, small average subthreshold-swing (SSavg) of 16.7 mV/dec, and small threshold voltage (VT) of 0.18 V.
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Acknowledgements
The authors would like to thank Electronics and Communication Department of National Institute of Technology, Jalandhar, for their valuable support in carrying out this research work.
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Mohit Mittal- Simulation and writing original draft preparation.
Mamta Khosla and Tulika Chawla- Supervision and writing-review.
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Mittal, M., Khosla, M. & Chawla, T. Design and Performance Analysis of Delta-Doped Hetro-Dielectric GeOI Vertical TFET. Silicon 14, 5503–5511 (2022). https://doi.org/10.1007/s12633-021-01315-w
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DOI: https://doi.org/10.1007/s12633-021-01315-w