Superior UV photodetector performance of TiO2 films using Nb doping
Graphical abstract
Introduction
Direct conversion of ultra-violet (UV) light energy into an electrical signal is a promising strategy for the construction of UV photodetectors [[1], [2], [3], [4], [5], [6], [7], [8], [9]]. Therefore, focus on the research and development of photodetector devices with enhanced sensitivity and speed is essential. Subsequently, photodetectors have found applications in a vast number of fields, such as laser welding, gas sensing, biomedical imaging, microelectronics, pollution monitoring, photoelectrodes, and defence devices [10,11]. Due to ozone-layer depletion, harmful UV radiation is penetrating our atmosphere. Exposure to such harmful UV-radiation is one of the prime factors that cause skin cancer and other diseases [12]. In addition, the amount of radiation exposed onto plants during vertical farming is required to continuously monitor and control growth to achieve improved yields. These factors urge the need for extensive research on developing UV photodetectors. Until now, very few suitable materials, such as ZnO, WO3, MoO3, TiO2, NiO, and Ga2O3, have been utilized in UV photodetectors [[13], [14], [15], [16], [17], [18]]. Transition metal oxide semiconductors have been studied over the past few years due to their abundance and chemical stability [19,20]. They have also found applications in electronics, optics, energy materials, photonic sensors, and lasers [[21], [22], [23], [24], [25], [26]]. Traditional semiconductor-based photodetectors, such as Si, Ge, and GaAs, have a narrow band gap, which absorbs a wide range of wavelengths in the electromagnetic spectrum, making them inappropriate for UV-photodetection. However, transition metal oxides have a wide band gap ranging from 2.2 to 4.0 eV, which can absorb UV-radiation and convert it into an electrical signal.
Among the transitional metal oxides reported to date, TiO2-based thin films have been extensively investigated for applications such as self-cleaning surfaces, air-water treatment, UV photodetectors, and deodorizers because of their strong oxidation capacity, profusion in nature, and strong photoactivity [[27], [28], [29], [30]]. Among the many ways to vary the band gap and electronic structure of the material to enhance the photoactivity of TiO2 films under UV illumination, doping could be one of the best solutions. Few reports exist on the TiO2-based photodetectors and several dopants, such as Co, Fe, Mn, Zn, Er, Nb, and Al, which exhibit the enhanced photoactivity in doped TiO2 compared to pristine TiO2 [[31], [32], [33], [34], [35], [36]]. Among these dopants, Nb is expected to effectively enhance the absorption of UV-radiation to achieve superior photodetector performance because pentavalent doping induces high charge carrier concentration and shifts the Fermi energy level towards the conduction band for efficient conversion of light into an electrical signal [37].
The present study aims to enhance the fundamental figures of merit, such as the responsivity, sensitivity, and response time of TiO2-based photodetectors under UV-illumination. In this work, Nb-doped TiO2 (TNO) films were deposited onto a Si/SiO2 substrate using a magnetron sputtering technique at different Nb-doping concentrations. X-ray diffraction (XRD), field-emission scanning electron microscopy (FESEM), and X-ray photoelectron spectroscopy (XPS) were carried out on the as-grown TNO films to study the structural, morphological, and surface chemical states, respectively. Furthermore, the photodetector parameters were also measured and determined to optimize the Nb-doping concentration in TiO2 films for active UV photodetector applications.
Section snippets
Experimental
Nb-doped TiO2 (TNO) thin films were deposited using a conventional radio frequency (RF) reactive magnetron sputtering method using pure titanium (Ti), 0.5 at.% Nb-doped Ti, and 1.0 at.% Nb-doped Ti targets. An argon-oxygen gas mixture was used at a working pressure of 2 mTorr with 4.0% oxygen partial pressure (pO2) at a substrate temperature of 200 °C. Si/SiO2 substrates were used for sake of compatibility with integrated circuit technologies. Prior to each deposition, the sputter chamber was
Structural properties
Fig. 1 shows the XRD patterns obtained for the RF sputtered Nb-doped TiO2 (TNO) films deposited at different Nb doping concentrations (0.0, 0.5, and 1.0 at.%). The XRD spectra for all the films evidently depict the reflection planes that belong to both the rutile (R) and anatase (A) phase of TiO2 when compared to the JCPDS No#021–1276. However, no other reflection planes correspond to Nb2O5, which confirms the appropriate doping of Nb5+ into the rutile phase of the TiO2 matrix. Thus, at lower
Conclusions
In this study, we have successfully synthesized high quality Nb-doped TiO2 (TNO) thin films with different Nb-doping concentrations via a sputtering technique and explored their application in UV photodetector devices. The crystalline structure of TiO2 and uniform distribution of grains have been confirmed using XRD and SEM studies, respectively. The XPS results confirmed the successful doping of Nb into the TiO2 crystal lattice and the doping effect of Nb on the electron transport efficiency
CRediT author statement
P.V. Karthik Yadav: Data curation, Visualization, Validation, Writing- Original draft preparation.
B. Ajitha: Data curation, Visualization, Validation, Writing- Original draft preparation, Writing- Review & Editing.
Captain M. Anees Ahmed: Visualization, Validation.
Y. Ashok Kumar Reddy: Conceptualization, Data Curation, Visualization, Validation, Writing - Review & Editing, Supervision.
Vasudeva Reddy Minnam Reddy: Visualization, Writing - Review & Editing.
Declaration of competing interest
The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
Acknowledgments
One of the authors (Dr. Y. Ashok Kumar Reddy) would like to acknowledge the Defence Research and Development Organisation (DRDO), Government of India (1115/CARS-78/TS/SPL/2020) and Department of Science and Technology (DST), New Delhi, Government of India for the award of DST-Inspire Faculty (DST/INSPIRE/04/2017/002531) to carry out the above work.
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These authors equally contributed to this manuscript.