Abstract
The paper presents the results of measuring the thermopower and resistivity of bismuth films in the thickness range from 1 μm to 10 nm, obtained by thermal evaporation in vacuum. The study is carried out in the temperature range 77–300 K by a method excluding the introduction of additional deformation into the film-substrate system by elements of the measuring cell. Plates of single-crystal mica (muscovite) are used as substrates. A significant dependence of the thermopower and thermoelectric power on the film thickness is found. The results are interpreted within the framework of classical and quantum-size effects of the restriction of the thickness and size of crystallites.
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Funding
This work was carried out with financial support from the Ministry of Education of Russia within the framework of a state assignment (project no. FSZN-2020-0026) and the Russian Foundation for Basic Research (grant no. 18-32-00242).
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Gerega, V.A., Grabov, V.M., Demidov, E.V. et al. Thermoelectric Power оf Thin Bismuth Films оn Mica. J. Surf. Investig. 15, 467–470 (2021). https://doi.org/10.1134/S1027451021030095
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DOI: https://doi.org/10.1134/S1027451021030095