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Investigation of Helimagnetism in Dy and Ho Thin Films by Neutron Reflectometry

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Abstract

In this paper, the results of investigating thin films of rare-earth helimagnetics (REMs) Dy and Ho by polarized neutron reflectometry are presented. It is shown that the growth by magnetron sputtering of rare-earth structures on sapphire substrates with a buffer layer Nb \(\left[ {1\bar {1}02} \right]\) Al2O3||[110]Nb||\(\left[ {0001} \right]R\) leads to complete relaxation of the Nb crystal lattices and the rare-earth film. It is found that some magnetic phase transitions typical of bulk Dy and Ho are not observed in 200 nm [0001]R thin films or are observed in a modified form. Differences between the Néel and Curie temperatures of thin REM films compared to bulk REMs are determined based on polarized-neutron-reflectometry data and measurements of the temperature dependence of the magnetization in the sample plane.

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ACKNOWLEDGMENTS

The synthesis and magnetometric measurements of the samples were performed at the Shared Use Center of the Institute of Metal Physics, Ural Branch, Russian Academy of Sciences.

Funding

This paper was supported by the Russian Foundation for Basic Research, project no. 19-32-90007.

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Authors and Affiliations

  1. Institute of Metal Physics, Ural Branch, Russian Academy of Sciences, 620108, Yekaterinburg, Russia

    D. I. Devyaterikov, E. A. Kravtsov & V. V. Proglyado

  2. Ural Federal University, 620002, Yekaterinburg, Russia

    E. A. Kravtsov

  3. Frank Laboratory of Neutron Physics, Joint Institute for Nuclear Research, 141980, Dubna, Russia

    V. D. Zhaketov & Yu. V. Nikitenko

Authors
  1. D. I. Devyaterikov
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  2. E. A. Kravtsov
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  3. V. V. Proglyado
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  4. V. D. Zhaketov
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  5. Yu. V. Nikitenko
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Corresponding authors

Correspondence to D. I. Devyaterikov or E. A. Kravtsov.

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Translated by N. Semenova

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Devyaterikov, D.I., Kravtsov, E.A., Proglyado, V.V. et al. Investigation of Helimagnetism in Dy and Ho Thin Films by Neutron Reflectometry. J. Surf. Investig. 15, 542–548 (2021). https://doi.org/10.1134/S102745102103023X

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  • DOI: https://doi.org/10.1134/S102745102103023X

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