Electronic structure of Tb0.5Sr0.5MnO3

T. Ly Nguyen, J. Rubio-Zuazo, G. R. Castro, F. M. F. de Groot, N. Hariharan, S. Elizabeth, M. Oura, Y. C. Tseng, H. J. Lin, and A. Chainani
Phys. Rev. B 103, 245131 – Published 21 June 2021

Abstract

We study the electronic structure of single-crystal Tb0.5Sr0.5MnO3, a non-charge-ordered mixed-valent semiconductor which exhibits a glassy magnetic ground state. We use the techniques of soft x-ray photoemission, hard x-ray photoemission, x-ray absorption, and resonant photoemission spectroscopy to investigate the occupied and unoccupied electronic states of Tb0.5Sr0.5MnO3. Core level photoemission and x-ray absorption spectroscopy allow us to determine the valence states of Tb, Sr, and Mn ions in Tb0.5Sr0.5MnO3. Model charge transfer multiplet calculations of core level photoemission and x-ray absorption spectra are employed to separate out the Mn3+ and Mn4+ states and confirm their relative concentrations. Resonant photoemission spectroscopy across the Mn 2p3d threshold shows clear resonant enhancement of the Mn 3d partial density of states and two-hole correlation satellites. A Cini-Sawatzky analysis gives on-site Coulomb energy Udd5.5±0.2 eV for the Mn 3dn states and Upd = 0.7 eV±0.2 eV for the Mn 3dn+1L̲1 states. The O 1s2p resonant photoemission is used to identify the O 2p two-hole correlation satellite which provides Upp3.4±0.2 eV for the O 2p states. Valence band photoemission indicates a small-gap semiconductor (<100 meV) consistent with electrical transport measurements. The estimated electronic structure parameters of the on-site Coulomb energies, in combination with the charge transfer energy and the hybridization strength obtained from the model calculations, indicate that Tb0.5Sr0.5MnO3 is a strongly correlated charge transfer type semiconductor.

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  • Received 30 March 2021
  • Accepted 27 May 2021

DOI:https://doi.org/10.1103/PhysRevB.103.245131

©2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

T. Ly Nguyen1,2, J. Rubio-Zuazo3,4, G. R. Castro3,4, F. M. F. de Groot5, N. Hariharan6, S. Elizabeth6, M. Oura7, Y. C. Tseng1,8, H. J. Lin2, and A. Chainani2,7

  • 1International College of Semiconductor Technology, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan
  • 2National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan
  • 3Spanish CRG BM25-SpLine Beamline at the ESRF, 71 avenue des Martyrs 38000 Grenoble, France and ESRF-The European Synchrotron CS 40220, 38043 Grenoble Cedex 09, France
  • 4Instituto de Ciencia de Materiales de Madrid, CSIC, Cantoblanco, E-28049 Madrid, Spain
  • 5Inorganic Chemistry and Catalysis, Utrecht University, Sorbonnelaan 16, 3584 CA Utrecht, Netherlands
  • 6Department of Physics, Indian Institute of Science, Bangalore 560012, India
  • 7RIKEN SPring-8 Center, Hyogo, Japan
  • 8Department of Materials Science and Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan

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Issue

Vol. 103, Iss. 24 — 15 June 2021

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