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A Detailed Investigation in the Enhancement Factor of Surface-Enhanced Raman Scattering in Simulation

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Abstract

The enhancement factor of surface-enhanced Raman scattering (SERS) is usually approximated by the fourth power of local electric field-enhanced strength. However, the applicability of the plane wave approximation used in this method remains a major problem in the theoretical study of SERS and the comparison with experiment results. In this work, we simultaneously calculated the local incident field enhancement factor under plane wave excitation and emission enhancement factor of a dipole in common SERS structures. For isolated particles and dimers, the local field enhancement factors are in good agreement with the emission enhancement factors. Nevertheless, the fourth power approximation method fails to predict the enhancement factors for structures on the substrate. The results show that when the SERS structures locate on the substrate, the local field method under-estimates the enhancement factor. The Purcell effect was used and compared with the emission enhancement. It indicates that the Purcell factor matches the emission enhancement quite well for the particles in homogeneous medium, while the Purcell factor over-estimates the emission enhancement for the particles on the substrate. These results are helpful for the SERS studies and the enhancement factor calculations.

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All data generated or analyzed during this study are included in this published article and its supplementary information files.

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Funding

This research was supported by the National Natural Science Foundation of China (Grant No. 12074054, 11704058) and the Fundamental Research Funds for the Central Universities (Grant No. DUT19RC (3)007).

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Author notes

  1. Junrong Zheng and Zehua Yang contributed equally.

Authors and Affiliations

  1. School of Physics, Dalian University of Technology, Dalian, 116024, People’s Republic of China

    Junrong Zheng, Zehua Yang, Yangzhe Guo & Yurui Fang

Authors
  1. Junrong Zheng
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  2. Zehua Yang
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  3. Yangzhe Guo
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  4. Yurui Fang
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Contributions

Y.F. supervised this work. J.Z. did enhanced numerical simulation and analyzed part of the data. Z.Y. analyzed the data. J.Z. and Z.Y. wrote the manuscript. Y.G. did the simulations for mode volume. All of the authors revised the paper.

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Correspondence to Yurui Fang.

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Zheng, J., Yang, Z., Guo, Y. et al. A Detailed Investigation in the Enhancement Factor of Surface-Enhanced Raman Scattering in Simulation. Plasmonics 16, 2207–2214 (2021). https://doi.org/10.1007/s11468-021-01442-5

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