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Rapid 3D Shape Measurement using Sine Pattern in Phase-Shifting Projection Method

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Abstract

The accuracy and speed of measurement are very important in a 3D measurement system using a DLP projector and a camera. In order to increase the accuracy, the measurement area is divided as small as possible by using a gray code. When the width of the pattern becomes narrower, the square pattern appears as a sine wave, making further division difficult. The sine wave shown here can be subdivided into a range of 2π using the phase-shifting method. This method is the most widely used measurement method called the SBM so far. It is a simple method to increase the accuracy by using gray codes with a short pitch, but there is a problem that the measuring time is lengthened due to an increase in the number of camera shots. In order to reduce the number, it is necessary to use fewer gray codes by using a long-period sine wave in the phase-shifting method. However, if the sine pattern is directly projected, an ideal sine wave cannot be obtained due to the gamma effect, so it is necessary to appropriately modify the fringe pattern and redesign. In this paper, we propose a method to compensate for the gamma effect in a sine pattern and show that an ideal sine wave can be generated even with a long periodic phase-shifting method. When the measuring speed and accuracy of the proposed method were compared with the SBM, it was confirmed through experiments that the measuring speed was increased by 25% at the same accuracy and the accuracy of the reference plane was improved by 7 times at the same speed.

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References

  1. Chen, F., Brown, G. M., & Song, M. (2000). Overview of three-dimensional shape measurement using optical methods. Optical Engineering., 39(1), 10–22.

    Article  Google Scholar 

  2. Kulkarni, R., & Rastogi, P. (2016). Optical measurement techniques—a push for digitization. Optics and Lasers in Engineering, 87, 1–17.

    Article  Google Scholar 

  3. Sansoni, G., Carocci, M., & Rodella, R. (1999). 3D vision based on a combination of gray code and phase shift light projection. Applied Optics, 38(31), 6565–6573.

    Article  Google Scholar 

  4. Tian, A., Jiang, Z., & Huang, Y. (2006). A flexible new three-dimensional measurement technique by projected fringe pattern. Optics & Laser Technology, 38, 585–589.

    Article  Google Scholar 

  5. Du, H., & Wang, Z. (2007). Three-dimensional shape measurement with an arbitrarily arranged fringe projection profilometry system. Optics Letters, 32(16), 2438–2440.

    Article  Google Scholar 

  6. Huang, L., Chua, P., & Asundi, A. (2010). Least-squares calibration method for fringe projection profilometry considering camera lens distortion. Applied Optics, 49(9), 1539–1548.

    Article  Google Scholar 

  7. Chung, B., & Park, Y. (2014). Hybrid method for phase-height relationship in 3D shape measurement using fringe pattern projection. International Journal of Precision Engineering and Manufacturing, 15, 407–413.

    Article  Google Scholar 

  8. Wu, Z., Guo, W., & Zhang, Q. (2019). High-speed three-dimensional shape measurement based on shifting Gray-code light. Optics Express, 27(16), 22631–22644.

    Article  Google Scholar 

  9. Wang, Y., Zhao, H., Jiang, H., & Li, X. (2018). Defocusing parameter selection strategies based on PSF measurement for square-binary defocusing fringe projection profilometry. Optics Express, 26(16), 20351–20367.

    Article  Google Scholar 

  10. Lei, S. Y., & Zhang, S. (2009). Flexible 3-d shape measurement using projector defocusing. Optics Letters, 34, 3080–3082.

    Article  Google Scholar 

  11. Ayubi, G. A., Ayubi, J. A., Di Martino, J. M., & Ferrari, J. A. (2010). Pulse-width modulation in defocused three-dimensional fringe projection. Optics Letters, 35, 3682–3684.

    Article  Google Scholar 

  12. Wang, Y., & Zhang, S. (2010). Optimal pulse width modulation for sinusoidal fringe generation with projector defocusing. Optics Letters, 35, 4121–4123.

    Article  Google Scholar 

  13. Wang, Y., & Zhang, S. (2012). Comparison of the squared binary, sinusoidal pulse width modulation, and optimal pulse width modulation methods for three-dimensional shape measurement with projector defocusing. Applied Optics, 51, 861–872.

    Article  Google Scholar 

  14. Hu, Q., Huang, P. S., Fu, Q., & Chiang, F.-P. (2003). Calibration of a three-dimensional shape measurement system. Optical Engineering, 42(2), 487–493.

    Article  Google Scholar 

  15. Maurel, A., Cobelli, P., Pagneux, V., & Petitjeans, P. (2009). Experimental and theoretical inspection of the phase-to-height relation in Fourier transform profilometry. Applied Optics, 48(2), 380–392.

    Article  Google Scholar 

  16. Zuo, C., Feng, S., Huang, L., Tao, T., Yin, W., & Chen, Q. (2018). Phase shifting algorithms for fringe projection profilometry: A review. Optics and Lasers in Engineering, 109, 23–59.

    Article  Google Scholar 

  17. https://en.wikipedia.org/wiki/Gamma_correction.

  18. Guo, H., He, H., & Chen, M. (2004). Gamma correction for digital fringe projection profilometry. Applied Optics, 43, 2906–2914.

    Article  Google Scholar 

  19. Zhang, X., Zhu, L., Li, Y., & Tu, D. (2012). Generic nonsinusoidal fringe model and gamma calibration in phase measuring profilometry. Journal of the Optical Society of America A, 29(6), 1047–1058.

    Article  Google Scholar 

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Acknowledgements

This work was supported by the 2020 Yeungnam University Research Grant.

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  1. School of Mechanical Engineering, Yeungnam University, 280 Daehak-ro, Gyeongsan, Gyeongbuk, 38541, South Korea

    Seung-Sin Kim & Byeong-Mook Chung

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  1. Seung-Sin Kim
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  2. Byeong-Mook Chung
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Correspondence to Byeong-Mook Chung.

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Kim, SS., Chung, BM. Rapid 3D Shape Measurement using Sine Pattern in Phase-Shifting Projection Method. Int. J. Precis. Eng. Manuf. 22, 1381–1389 (2021). https://doi.org/10.1007/s12541-021-00545-7

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  • DOI: https://doi.org/10.1007/s12541-021-00545-7

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