Abstract
A bipolar resistance switching memory effect is observed in the Ta/BiFeO3/carbon/BaTiO3/Si structure. The resistance switching (RS) behavior can be modulated by an optical signal. The HRS/LRS resistance ratio and threshold voltage change remarkably under white-light irradiation. The trap-based charges in the Schottky-like depletion layers excited by the white light are responsible for the white-light controlled RS memory behaviors. This research is useful in exploring multi-functional materials and applications in optical-controlled nonvolatile memory devices.
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The research was supported by the national Science Foundation of China (Grant No. 51372209).
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Li, X., Li, X. & Chen, P. A Visible Light Modulated Resistive Switching Memory Behaviors in the Ta/BiFeO3/Carbon/BaTiO3/Si Device. J. Electron. Mater. 50, 3972–3975 (2021). https://doi.org/10.1007/s11664-021-08920-w
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DOI: https://doi.org/10.1007/s11664-021-08920-w