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An end-to-end denoising autoencoder-based deep neural network approach for fault diagnosis of analog circuit

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Abstract

Fault diagnosis of analog circuit is critical to improve safety and reliability in electrical systems and reduce losses. Traditional fault diagnosis methods of analog circuit usually rely on the hand design feature extractor and can not generalize well to other diagnosis domains. To address these issues, an end-to-end denoising autoencoder (EEDAE)-based fault diagnosis approach is proposed. The proposed approach includes denoising autoencoder (DAE) and a softmax classifier. The DAE is designed to automatically extract fault features from the raw time series signals without any signal processing techniques and diagnostic expertise, and then the softmax classifier is used to classify the fault mode of analog circuits. Specifically, we design a novel loss function by jointly minimizing reconstruction loss and classification loss to improve training efficiency. The proposed approach just has one training stage, in which the encoder, decoder, and classifier are trained simultaneously. The experimental results demonstrate that compared with traditional methods, the proposed method has higher accuracy and lower requirements on data.

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Code availability

The code in this study can be downloaded from https://github.com/yangtriple/analog-circuit-fault-diagnosis-based-on-deep-autoencoder-

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Funding

This work was supported in part by the Science and Technology Research and Development Program of China National Railway Corporation Limited under Grant N2020J007.

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Authors and Affiliations

  1. School of Electrical Engineering, Beijing Jiaotong University, Beijing, 100044, China

    Yueyi Yang, Lide Wang, Huang Chen & Chong Wang

Authors
  1. Yueyi Yang
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  2. Lide Wang
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  3. Huang Chen
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  4. Chong Wang
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Contributions

YY designed the study and wrote the paper; LW contributed significantly to analysis and manuscript preparation; HC and CW help perform the analysis with constructive discussions.

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Correspondence to Yueyi Yang.

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Yang, Y., Wang, L., Chen, H. et al. An end-to-end denoising autoencoder-based deep neural network approach for fault diagnosis of analog circuit. Analog Integr Circ Sig Process 107, 605–616 (2021). https://doi.org/10.1007/s10470-021-01835-w

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