Abstract
Purpose
During atomic force microscope operation, electrostatic, capillary, and van der Waals forces contribute significantly to AFM tip–sample interaction. This paper presents the effects of probe retracting velocities on the tip–sample interaction and reveals the discrepancies of the interaction measured from the surfaces of different hardness and wettability.
Methods
In this work, the effects of retracting velocities on probe vibration were studied by simultaneously investigating variation of the force, amplitude, and phase with vertical displacement (f–d, a–d and p–d curves) upon AFM tip leaving a silicon surface. The same measurement was also conducted on the samples of different hardness and wettability to investigate their effects on the interaction.
Results
It is found that the slopes of the f–d, a–d or p–d curves decrease with the increase of retracting velocity. In addition, the slope of the a–d curve collected on the hydrophilic silicon surface presents an abrupt change during the amplitude increase. Besides, the amplitude and phase have a long changing process with probe displacement when the probe is retracted from a polyvinyl chloride surface.
Conclusion
The results indicate that the increase in the velocity causes the tip–sample interaction to decrease more slowly with the probe displacement, and the interaction is greater as the probe retracts from soft or hydrophilic surface under the same conditions. The study provides an opportunity for deeper understanding tip–sample interaction and may shed new light on comparing the hardness and wettability of materials through investigating AFM probe vibrations.
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Data availability
All data generated or analysed during this study are included in this published article (and its supplementary information files).
References
Johnson D, Hilal N (2015) Characterisation and quantification of membrane surface properties using atomic force microscopy: a comprehensive review. Desalination 356:149–164
Meng F, Liao B, Liang S et al (2010) Morphological visualization, componential characterization and microbiological identification of membrane fouling in membrane bioreactors (MBRs). J Membr Sci 361:1–14
Urbakh M, Meyer E (2010) The renaissance of friction. Nat Mater 9:8–10
O’Callahan BT, Yan J, Menges F et al (2018) Photoinduced tip−sample forces for chemical Nanoimaging and spectroscopy. Nano Lett 18:5499–5505
Dufrêne YF, Ando T, Garcia R et al (2017) Imaging modes of atomic force microscopy for application in molecular and cell biology. Nat Nanotechnol 12:295–307
Dehnert M, Magerle R (2018) 3D depth profiling of the interaction between an AFM tip and fluid polymer solutions†. Nanoscale 10:5695–5707
Major RC, Houston JE, McGrath MJ et al (2006) Viscous water meniscus under nanoconfinement. Phys Rev Lett 96(17):177803
Stamou D, Duschl C, Johannsmann D (2000) Long-range attraction between colloidal spheres at the air-water interface: the consequence of an irregular meniscus. Phys Rev E 62(4):5263
Efremov YM, Wang WH, Hardy SD et al (2017) Measuring nanoscale viscoelastic parameters of cells directly from AFM force-displacement curves. Sci Rep 17(1):1–14
Liu J, Li K (2021) Sparse identification of time-space coupled distributed dynamic load. Mech Syst Signal Process 148(1):107177
Liu J, Sun X, Han X et al (2015) Dynamic load identification for stochastic structures based on Gegenbauer polynomial approximation and regularization method. Mech Syst Signal Process 56–57:35–54
Kawai S, Foster AS, Björkman T et al (2016) Van der Waals interactions and the limits of isolated atom models at interfaces. Nat Commun 7:11559
Dagdeviren OE, Schwarz UD (2019) Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: dependence on oscillation amplitude, interaction strength, and tip-sample distance. Rev Sci Instrum 90(3):033707
Tamayo J, García R (1998) Relationship between phase shift and energy dissipation in tapping-mode scanning force microscopy. Appl Phys Lett 73(20):2926–2928
Martin Y, Williams CC, Wickramasinghe HK (1987) Atomic force microscope–force mapping and profiling on a sub 100-Å scale. J Appl Phys 61(10):4723–4729
García R, Paulo AS (2000) Amplitude curves and operating regimes in dynamic atomic force microscopy. Ultramicroscopy 82(1–4):79–83
Korayem MH, Kavousi A, Ebrahimi N (2011) Dynamic analysis of tapping-mode AFM considering capillary force interactions. Scientia Iranica B 18(1):121–129
Hölscher H (2006) Quantitative measurement of tip-sample interactions in amplitude modulation atomic force microscopy. Appl Phys Lett 89(12):123109
Kim Y, Yang YI, Choi I et al (2010) Dependence of approaching velocity on the force-distance curve in AFM analysis. Korean J Chem Eng 27(1):324–327
Yan Y, Sun T, Liang Y et al (2007) Investigation on AFM-based micro/nano-CNC machining system. Int J Mach Tools Manuf 47:1651–1659
Hou J, Liu L, Wang Z et al (2013) AFM-based robotic nano-hand for stable manipulation at nanoscale. IEEE Trans Autom Sci Eng 10(2):285–295
Yu B, Qian L, Yu Z, Zhou Z (2009) Effects of tail group and chain length on the tribological behaviors of self-assembled dual-layer films in atmosphere and in vacuum. Tribol Lett 34(1):1
Santos S, Gadelrab KR, Silvernail A et al (2012) Energy dissipation distributions and dissipative atomic processes in amplitude modulation atomic force microscopy. Nanotechnology 23(12):125401
García R, Paulo AS (1999) Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy. Phys Rev B 60(7):4961
Haugstad G, Jones RR (1999) Mechanisms of dynamic force microscopy on polyvinyl alcohol: region-specific non-contact and intermittent contact regimes. Ultramicroscopy 76(1–2):77–86
Delrio FW, Boer MPD, Knapp JA et al (2005) The role of van der Waals forces in adhesion of micromachined surfaces. Nat Mater 4(8):629–634
Blackman GS, Mate CM, Philpott MR (1990) Interaction Forces of a Sharp Tungsten Tip with Molecular Films on Silicon Surfaces. Phys Rev Lett 65(18):2270
Chen L, Yu X, Wang D (2007) Cantilever dynamics and quality factor control in AC mode AFM height measurements. Ultramicroscopy 107(4–5):275–280
Martínez NF, García R (2006) Measuring phase shifts and energy dissipation with amplitude modulation atomic force microscopy. Nanotechnology 17(7):S167
Zamora RRM, Sanchez CM, Freire FL Jr, Prioli R (2004) Influence of capillary condensation of water in nanoscale friction. Physica Status Solidi (a) 201(5):850–856
Symans MD, Charney FA, Whittaker AS et al (2008) Energy Dissipation Systems for Seismic Applications: Current Practice and Recent Developments. J Struct Eng 134(1):3–21
Bhushan B, Liu H, Hsu SM (2004) Adhesion and friction studies of silicon and hydrophobic and low friction films and investigation of scale effect. J Tribol-Trans Asme 126(3):583–590
Luna M, Colchero J, Baró AM (1998) Intermittent contact scanning force microscopy: the role of the liquid necks. Appl Phys Lett 72(26):3461–3463
Stifter T, Marti O, Bhushan B (2000) Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning force microscopy. Phys Rev B 60(20):13667
Tusset AM, Ribeiro MA, Lenz WB et al (2020) Time delayed feedback control applied in an atomic force microscopy (AFM) model in fractional-order. J Vib Eng Technol 8:327–335
Hölscher H, Schwarz UD (2007) Theory of amplitude modulation atomic force microscopy with and without Q-Control. Int J Non-Linear Mech 42(4):608–625
Jani N, Chakraborty G (2020) Parametric resonance in cantilever beam with feedback-induced base excitation. J Vib Eng Technol 9:291–301
García R, Pérez R (2002) Dynamic atomic force microscopy methods. Surf Sci Rep 47(6):197–301
Flores P, Margarida M, Silva MT, Martins JM (2011) On the continuous contact force models for soft materials in multibody dynamics. Multibody SysDyn 25(3):357–375
Hoffmann PM, Jeffery S, Pethica JB et al (2001) Energy dissipation in atomic force microscopy and atomic loss processes. Phys Rev Lett 87(26):265502
Acknowledgements
The authors would like express thanks to Dr. Junhui Sun for his valuable comments.
Funding
The research was supported by the National Natural Science Foundation of China (51775462).
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Deng, L., Wu, L., Chen, P. et al. Effects of Retracting Velocities on the Vibration of Atomic Force Microscope Probe on Different Surfaces. J. Vib. Eng. Technol. 9, 1305–1315 (2021). https://doi.org/10.1007/s42417-021-00298-7
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DOI: https://doi.org/10.1007/s42417-021-00298-7