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Validation of the QTL for grain length linked to the Rht-B1 locus in two genetic backgrounds of bread wheat (Triticum aestivum L.)

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Abstract

Grain size is an important agronomic trait that influences the yield and end-use quality of bread wheat (Triticum aestivum L.). We conducted quantitative trait loci (QTL) analysis using recombinant inbred lines derived from a cross of a semi-dwarf modern variety with large grains (Zenkoujikomugi: Zen) and a landrace with small grains (Chinese Spring: CS). Grain size was evaluated as grain length (GL), grain width (GW), grain thickness (GT), and thousand-grain weight (TGW) under two environmental conditions. A major QTL (QGl.obu-4B) associated with GL was detected in both environments near the Rht-B1 locus for the semi-dwarf trait on chromosome 4B, despite Zen and CS having the same Rht-B1a allele. No QTL for GW was found in the QGl.obu-4B region, and QTLs for GT and TGW was detected in only one environment. To validate the effect of QGl.obu-4B, we developed two backcrossed populations in the CS and Zen genetic backgrounds. The Zen-derived allele conferred larger GL, GW, and GT, resulting in greater TGW (13.7% increase compared to the CS-derived allele) in the CS background. In contrast, the QGl.obu-4B effect was smaller in the Zen background, and the Zen-derived allele increased TGW by only 7.0%. The QTL was located within the 168-Mbp region tightly linked to the Rht-B1 locus. Further characterization and fine-mapping of QGl.obu-4B will facilitate the use of this allele by marker-assisted selection in wheat breeding programs.

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Acknowledgements

The authors are grateful to Ms. M. Tokui for her technical assistance.

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Correspondence to Kazumitsu Onishi.

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Communicated by A. Börner.

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Onishi, K., Akie, T., Cao, L. et al. Validation of the QTL for grain length linked to the Rht-B1 locus in two genetic backgrounds of bread wheat (Triticum aestivum L.). CEREAL RESEARCH COMMUNICATIONS 49, 559–566 (2021). https://doi.org/10.1007/s42976-021-00148-y

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  • DOI: https://doi.org/10.1007/s42976-021-00148-y

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