Optical and structural characteristics of electrodeposited Cd 1-xZnxS nanostructured thin films
Graphical abstract
Introduction
CdS is one of the attractive members of II-VI type semiconducting compounds. The wide range of optoelectronic device applications of the compound has kept the research interest on the CdS warm. The solar cells, light emitting diodes, nonlinear optics, transistors, sensors are some of the devices in which CdS has been used for years [[1], [2], [3], [4]]. CdS has been grown in various forms like single crystal, thin film, nanoparticle, nanowire. CdS exhibits two crystalline structures of cubic and hexagonal phases. The lattice constant of the cubic phase was reported as a = 5.832 Å while those of the hexagonal phase were obtained as a = 4.130 Å and c = 6.703 Å [5]. The direct band gap energy of the compound has been reported around 2.48 eV which is suitable especially for solar cell applications [6].
CdS compounds have been grown with various dopants like Mn, Cu, Al, Co, Gd, Ag, Pd and etc. [[7], [8], [9], [10]]. The addition of dopant may improve the structural and optical characteristics of the CdS for the purpose. One of the most studied and doped elements is zinc (Zn) which forms Cd1-xZnxS compounds in a wide range of composition (0 ≤ x ≤ 1) [11]. The significance of Zn among the other dopants come due to its large optical transmittance and closer ionic radius with Cd () [6]. The cheapness, abundance, and non-toxicity properties of the Zn are also appreciable advantages for technological applications [12]. The direct band gap energies of the prepared Cd1-xZnxS thin films were reported as increasing from 2.33 eV (x = 0) to 3.33 eV (x = 1). The remarkable shift of the band edge with composition provides the mixed compounds attractive position in optoelectronic devices. The role of the Zn substitution on nonlinear optical characteristics of the CdS was investigated and analyses showed that third-order nonlinear optical parameters of the compound improve [6].
One of the important optical parameters for compounds utilized in optoelectronic applications is band gap energy. Since temperature affects the band gap energy of the semiconducting materials, temperature-dependent band gap energy characteristics take an effective position in device fabrication. The temperature dependency of band gap energy of CdS thin films grown by thermal evaporation technique was reported in Ref. [13]. However, nanostructured Cd1-xZnxS thin films have not been investigated so far in a similar way. The present paper aims to grow nanostructured Cd1-xZnxS (x = 0.05) thin films by electrodeposition method and characterize its structural and temperature-tuned band gap energy properties. Since compositional dependence of nanostructured Cd1-xZnxS thin films was previously reported in the literature [[14], [15], [16], [17]], temperature-dependent band gap characteristic of the Cd1-xZnxS thin films was considered only for x = 0.05 to give a general view about this point. Structural properties of the films were studied utilizing x-ray diffraction (XRD), energy dispersive spectroscopy (EDS) and scanning electron microscopy (SEM) methods. The crystalline structure, atomic compositional ratio and surface morphology of the nanostructured thin films were determined by applying these experimental techniques. Optical properties of the films were considered using Raman and temperature-dependent transmission measurements. The variation of the band gap energy with temperature was revealed for Cd1-xZnxS (x = 0.05) films and the band gap energy vs. temperature dependency was analyzed under the light of Varshni optical model.
Section snippets
Experimental details
Nanostructured CdZnS thin films were deposited by the electrodeposition technique. Thin films were cathodically electrodeposited from an aqueous electrolytic solution containing 5 mM of cadmium chloride (CdCl2) powder with 99.99% purity as Cd source, 1 mM of zinc chloride (ZnCl2) as zinc source, and 50 mM sodium thiosulphate (Na2S2O3) as a sulphur source in 100 ml of deionized water. All the chemicals were laboratory reagent grade purchased from Sigma-Aldrich. Dilute sulfuric acid (H2SO4) and
Structural properties
The crystalline structure of the grown CdZnS thin films was determined by carrying out the XRD measurements which presented the diffraction pattern shown in Fig. 1. Both of the diffraction patterns of the ITO substrate and CdZnS/ITO structure were given in the figure. As seen CdZnS/ITO structure exhibits two additional peaks around 27.60° and 45.05° which are associated with (111) and (220) planes of cubic crystalline structure with lattice constants of a = 5.832 Å [5]. The presence of
Conclusion
Cd1-xZnxS nanostructured thin films grown by electrodeposition method for the composition of x ≈ 0.05 were investigated by structural and optical characterization methods. XRD pattern presented two diffraction peaks associated with (111) and (220) planes of cubic crystalline structure. SEM image of the film presented that grown thin film is well-defined nanostructured. Raman spectrum of the CdZnS thin film exhibited two peaks around 303.4 and 607.3 cm−1 associated with the longitudinal optical
CRediT authorship contribution statement
K. Erturk: Conceptualization, Resources, Investigation, Writing – original draft. M. Isik: Conceptualization, Investigation, Formal analysis, Methodology, Writing – original draft. M. Terlemezoglu: Investigation, Resources, Writing – review & editing. N.M. Gasanly: Supervision, Writing – review & editing.
Declaration of competing interest
The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
Acknowledgement
Authors gratefully acknowledge Dr. Raşit Turan and Dr. Mehmet Parlak for using their facilities to carry out the measurements in Center for Solar Energy Research and Applications (GÜNAM) in Middle East Technical University.
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