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The Influence of Space-Charge-Limited Current on the Dielectric Properties of Polycrystalline Films of Fullerite C60

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Abstract

The dielectric properties of polycrystalline fullerite films with a thickness of ~300 nm included in p-Si/C60/InGa structures under dc electric fields with a strength up to 3.3 × 107 V/m have been investigated in the frequency range of 30–106 Hz. It is established that, at negative polarity of an InGa electrode (when electron injection from the metal to fullerite is facilitated), an anomalous increase in the sample capacitance is observed at frequencies below 1000 Hz (the capacitance at a low frequency is higher than that at a high frequency by a factor of more than 103). An explanation for this effect is proposed.

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Authors and Affiliations

  1. Peter the Great St. Petersburg Polytechnic University, 195251, St. Petersburg, Russia

    D. I. Dolzhenko, V. F. Borodzyulya, I. B. Zakharova & N. T. Sudar’

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  1. D. I. Dolzhenko
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  2. V. F. Borodzyulya
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  3. I. B. Zakharova
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  4. N. T. Sudar’
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Correspondence to N. T. Sudar’.

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Translated by A. Sin’kov

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Dolzhenko, D.I., Borodzyulya, V.F., Zakharova, I.B. et al. The Influence of Space-Charge-Limited Current on the Dielectric Properties of Polycrystalline Films of Fullerite C60 . Tech. Phys. 66, 53–58 (2021). https://doi.org/10.1134/S1063784221010059

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