Tuning of defects induced visible photoluminescence by swift heavy ion irradiation and thermal annealing in zinc oxide films
Introduction
Zinc oxide is an n-type semiconductor exhibiting wurtzite hexagonal structure at ambient conditions. It has a wide bandgap of 3.37 eV and high excitonic binding energy of 60 meV (greater than room temperature thermal energy of around 25 meV) (Özgür et al., 2005a). ZnO unique properties make it a suitable candidate for many applications such as solar cell (Hüpkes et al., 2012; Bhosle et al., 2007), light-emitting diode (LED) (Xu et al., 2006; Willander et al., 2009; Ryu et al., 2006), gas sensors (Zhu and Zeng, 2017; Shishiyanu et al., 2005), UV detectors (Vettumperumal et al., 2014; Soni et al., 2020), etc. Investigation on the luminescence properties of ZnO is still going on to fully utilize its properties for solid-state light-emitting applications. Generally, ZnO shows a sharp emission band in the ultra-violet region (UV) and a broad emission band in the visible region of solar spectrum (Özgür et al., 2005b). The emission band in UV-region known as near band edge emission has been reported widely and attributed to exciton recombination or the band to band transition (conduction band to valence band or vice-versa). While the emission band in the visible region known as deep-level emission attributed to the extrinsic and intrinsic defects present in the ZnO films. The intrinsic defects (sometimes called as native point defects) in ZnO are zinc vacancy (VZn), zinc interstitial (Zni), oxygen vacancy (VO), oxygen interstitial (Oi), zinc and oxygen antisites (OZn and ZnO) and so on (Oba et al., 2011; Look et al., 2005). In which Zni acts as a shallow donor, VZn acts as a shallow acceptor, VO act as a deep donor, and Oi act as a deep acceptor (Lyons et al., 2017; Janotti and Van de Walle, 2007). In particular, in the case of ZnO, it is difficult to avoid intrinsic defects completely due to its non-stoichiometric behavior. Nevertheless, the luminescence behavior of ZnO can be tuned in a controlled manner by controlling the number of defects according to the desire application. Luminescence properties of ZnO get affected by various parameters such as a method of deposition (Thongpool et al., 2019; Fan et al., 2005; Barbagiovanni et al., 2015), the structure of ZnO (Cao et al., 2019; Kabir et al., 2018; Vanheusden et al., 1996), type of dopant (Musavi et al., 2019; Naik et al., 2020; Khranovskyy et al., 2017), doping concentration (Gupta et al., 2019; Kim et al., 2012; Horng et al., 2016), annealing temperature (Ambrosio et al., 2019; Kang et al., 2004) and environment (Gruzintsev and Yakimov, 2005; Singh et al., 2011a) also plays a crucial role in luminescence properties of ZnO).
It has been reported previously by our group (Singh et al., 2011a), that annealing environment or annealing temperature has a significant effect on the luminescence properties of ZnO thin films. We showed that the efficiency of visible luminescence increases with increasing annealing temperature and also in the reduced environment (annealing in Ar-gas) the intensity of visible emission evolved which was attributed to increase in the concentration of deep-level defects. In another report by H. Kang et al. (2004), also supports our previous work that the intensity of visible emission increases with an increase in annealing temperature. But the origin behind visible luminescence is contradictory in many reports and the research is still going on to find out the exact origin of visible emission such as green emission. Further, it is well known that visible luminescence in ZnO can be tuned by controlling the type and concentration of defects present in the system. In this context, ion irradiation is the best tool to create defects into a material in a controlled manner by varying irradiation parameters such as ion species, ion beam current, ion fluences, and ion energy, etc. There are some reports available on the effect of ion irradiation on luminescence properties (Kumar et al., 2013a; Gautam et al., 2015; Singh et al., 2009; Sharma et al., 2011). Recently, H. Gupta et al. (2019), reported that with ion irradiation the visible emission can be tuned. Thus it would be interesting to study the luminescence behavior of ZnO thin films by combing annealing conditions and ion irradiation.
In view of this, the sol-gel spin coating grown films annealed at 500 °C in an oxygen environment, 500 °C in an argon environment, and 700 °C in argon environment are irradiated using 50 MeV Ni and 120 MeV Au ions with different fluences. Two annealing temperatures were chosen to have two different types of microstructure and surface morphology. The nanostructured films are modified by SHIs with varying electronic energy deposition into the ZnO films. These ions loose negligible energy in nuclear scattering as compared to the electronic energy deposition and the range of the ions is much larger than the thickness of the ZnO films. Therefore, ions are implanted deep inside the Si substrates and the modification in the ZnO thin films are mainly expected due the electronic energy deposition via these incident ions in the ZnO films.
Section snippets
Experimental details
ZnO thin films of thickness about 300 nm (Gupta et al., 2020) were deposited on a silicon substrate via the sol-gel spin coating method. The details of film preparation were reported elsewhere (Singh et al., 2011a). The as-deposited films were thermally annealed in two different environments (oxygen and argon) at two different annealing temperatures (500 °C and 700 °C) for 1 h. Further, all the thin films were irradiated with 50 MeV Ni and 120 MeV Au ions at varying ion fluences using 15 UD
Structural properties
Fig.-1(a), (a’), (b), and (b’) show the GAXRD pattern of Set-A, Set-B, Set-C, and Set-D films, respectively with different ion fluences. The XRD pattern for the samples of all four sets shows (100), (002), (101), (102), and (110) diffraction peaks. This indicates hexagonal wurtzite structure [JCPDS 36–1451] of all of the films and all films possess polycrystalline nature. The most preferred orientation of all of the films is along the c-axis. The width of (002) diffraction peak increases with
Conclusions
The effect of annealing temperature, annealing environment, and swift heavy ion irradiation on the luminescence properties of ZnO thin films are systematically studied. XRD pattern showed that all the films were polycrystalline. The average grain size was increased with annealing temperature, while it shows reduction upon ion irradiation with Au ions. Also, films irradiated with Au ions exhibit stress and strain along the c-axis in the film. The presence of stress and strain in the case of
CRediT authorship contribution statement
R.G. Singh: Investigation, Data curation, Formal analysis, Writing – original draft. Himanshi Gupta: Resources, Validation. R.M. Mehra: Conceptualization, Visualization, Supervision. Fouran Singh: Conceptualization, Investigation, Visualization, Formal analysis, Writing – review & editing.
Declaration of competing interest
The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
Acknowledgments
The authors are grateful to Dr. D. K. Avasthi for the moral encouragements and Dr. A. Tripathi for the experimental support in AFM investigations. The authors are also thankful to the Pelletron group of IUAC for providing a stable beam during the irradiation experiment and IUAC for providing the beamtime through project: UFUP-37320..
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