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Penetration of Electromagnetic Radiation Energy into a Semiconductor Element Base of Technical Means without Specialized Receiving Antennas

  • PHYSICAL PROCESSES IN ELECTRON DEVICES
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Abstract

In this paper, we solve the problem of dissipation of the energy of electromagnetic radiation in semiconductor devices of technical means, in which the fields are captured not by directional frequency-selective antennas, but by multidirectional receptors. The impact of both narrow-band microwave pulses with various carrier frequencies and ultrashort electromagnetic pulses, the spectrum of which extends to frequencies on the order of several GHz, is considered. The calculation results agree with the published experimental data.

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REFERENCES

  1. D. Nitsch, M. Camp, F. Sabath, et al., IEEE Trans. Electromagn. Compat. 46, 380 (2004).

    Article  Google Scholar 

  2. M. Camp, H. Gerth, H. Garbe, and H. Haas, IEEE Trans. Electromagn. Compat. 46, 368 (2004).

    Article  Google Scholar 

  3. R. Hoad, N. Carter, D. Herke, and S. Watkins, IEEE Trans. Electromagn. Compat. 46, 390 (2004).

    Article  Google Scholar 

  4. Yu. G. Yushkov, P. Yu. Chumerin, S. N. Artemenko, S. A. Novikov, and D. V. Zelentsov, J. Commun. Technol. Electron. 46, 944 (2001).

    Google Scholar 

  5. A. V. Klyuchnik, Yu. A. Pirogov, and A. V. Solodov, J. Commun. Technol. Electron. 56, 342 (2011).

    Article  Google Scholar 

  6. M. Camp, H. Garbe, and F. Sabath, in Proc. IEEE Int. Symp. in Electromagnetic Compatibility, Chicago, Aug. 8–12 (IEEE, New York, 2005), Vol. 2, p. 483.

  7. V. G. Usychenko and L. N. Sorokin, Hardness of ultra-high-frequency radio receivers to electromagnetic impacts (Radiotekhnika, Moscow, 2017).

    Google Scholar 

  8. B. B. Akbashev, A. I. Aleshko, Yu. V. Galich, et al., Tekhnol. EMS, No. 1 (24), 22 (2012).

    Google Scholar 

  9. K. Yu. Sakharov, A. V. Sukhov, V. L. Ugolev, and Yu. M. Gurevich, in Proc. 2018 Int. Symp. on Electromagnetic Compatibility (EMC Europe), Amsterdam, Aug. 27–30, 2018 (IEEE, New York, 2018), p. 40.

  10. Ultra-Wideband, Short-Pulse Electromagnetics, Eds. by F. Sabath, D. V. Giri, F. Rachidi, and A. F. Kaelin (Springer-Verlag, New York, 2010), p. 325.

  11. GOST R 51317.2.5-2000 Electromagnetic Compatibility of Technical Means. Electromagnetic Environment. Classification of Electromagnetic Interference in Technical Facilities Locations (Gosstandart Rossii, Moscow, 2001). https://meganorm.ru/Data2/1/4294813/4294813400.pdf.

  12. L. N. Zdukhov, Yu. V. Parfenov, O. A. Tarasov, and V. M. Chepelev, Tekhnol. EMS, No. 2 (65), 22 (2018).

    Google Scholar 

  13. A. Z. Fradin, Microwave Antennas (Sovetskoe Radio, Moscow, 1957; Pergamon, New York, 1961).

  14. A. P. Stepovik, E. Yu. Shamaev and M. M. Armanov, J. Commun. Technol. Electron. 62, 910 (2017).

    Article  Google Scholar 

  15. V. B. Avdeev, A. V. Berdyshev, I. A. Grigor’ev, and V. V. Shcherenkov, Antenny, No. 4 (119), 23 (2007).

  16. H. Meinke und F. Gundlach, Taschenbuch der Hochfrequenztechnik (Springer-Verlag, Berlin, 1956; Gosenergoizdat, Moscow, 1960), B. 1.

  17. I. S. Gonorovskii, Radio Circuits and Signals (Sov. Radio, Moscow, 1977) [in Russian].

    Google Scholar 

  18. V. M. Dwyer, A. J. Franklin, and D. S. Campbell, Solid-State Electron. 33, 553 (1990).

    Article  Google Scholar 

  19. IEC 61000-2-13. Electromagnetic Compatibility (EMC) – Part 2-13: Environment – High-Power Electromagnetic (HPEM) Environments – Radiated and Conducted. https://www.techstreet.com/standards/iec-61000-2-13-ed-1-0-en-2005?product_id=1210737.

  20. GOST R 52863-2007. Information Protection. Automated Systems in a Secure Version. Tests for Resistance to Intentional Force Electromagnetic Effects. General Requirements (Standartinform, Moscow, 2008). https://meganorm.ru/Data/474/47480.pdf.

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Funding

This study was supported by the Russian Foundation for Basic Research, project no. 19-29-06010.

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Authors and Affiliations

  1. State Research Institute of Applied Problems, 191167, St. Petersburg, Russia

    V. G. Usychenko & L. N. Sorokin

  2. St. Petersburg Institute for Informatics and Automation, Russian Academy of Sciences, 199178, St. Petersburg, Russia

    A. S. Usychenko

Authors
  1. V. G. Usychenko
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  2. L. N. Sorokin
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  3. A. S. Usychenko
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Corresponding authors

Correspondence to V. G. Usychenko, L. N. Sorokin or A. S. Usychenko.

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Translated by A. Ivanov

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Usychenko, V.G., Sorokin, L.N. & Usychenko, A.S. Penetration of Electromagnetic Radiation Energy into a Semiconductor Element Base of Technical Means without Specialized Receiving Antennas. J. Commun. Technol. Electron. 65, 1448–1456 (2020). https://doi.org/10.1134/S1064226920110170

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  • DOI: https://doi.org/10.1134/S1064226920110170

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