Abstract
In this study, an estimation approach based on local bus measurements of voltage, current and phase angle is presented to assess voltage stability at any of the system load bus. For this purpose, Thevenin equivalent circuit parameters of the IEEE 30-bus standard test system are estimated by using local measurements from Bus k which is selected to be evaluated in terms of voltage stability. Estimated Thevenin equivalent circuit parameters are used to calculate critical voltage values and voltage stability margin values of Bus k online for the voltage stability assessment. In conclusion, the voltage stability margin results of the proposed approach are compared with three different Thevenin equivalent based voltage stability estimation approaches. Simulation results show that the proposed approach successfully estimates the voltage stability margins of any load bus in the system. From the perspective of voltage stability, estimated voltage stability margins can be used to assess the loading levels of any load bus, to define critical busses and to make decision for load shedding.
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Abbreviations
- V k :
-
Voltage of Bus k
- V k(i) :
-
ith Voltage measurement of Bus k
- I k :
-
Current of Bus k
- I k(i) :
-
ith Current measurement of Bus k
- δ (i) :
-
Load angle estimate for ith measurement
- φ k :
-
Power angle of Bus k
- φ ki :
-
ith Power angle measurement of Bus k
- R Th :
-
Thevenin resistance
- X Th :
-
Thevenin reactance
- Z Th :
-
Thevenin impedance
- E Th :
-
Thevenin voltage
- E Th(i) :
-
ith Estimated Thevenin Voltage for ith Bus k
- θ :
-
Thevenin impedance angle
- X :
-
Reactance
- R :
-
Resistance
- Z L :
-
Load impedance
- I cr :
-
Critical current
- V kcr(i) :
-
Estimated critical voltage of Bus k for ith measurement
- VSM V :
-
Voltage stability margin
- VSM V(i) :
-
Voltage stability margin for ith measurement
- ISI :
-
Local voltage stability index
- VSI Bus :
-
Voltage stability index
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Gümüş, T.E., Yalçın, M.A., Turan, M. et al. Steady State Voltage Stability Estimation by Using Local Bus Parameters. J. Electr. Eng. Technol. 16, 853–860 (2021). https://doi.org/10.1007/s42835-021-00657-0
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DOI: https://doi.org/10.1007/s42835-021-00657-0