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Gamma irradiation induced microstructural modification and electrical conductivity of bakelite resistive plate chamber material

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Abstract

Polymer-based Bakelite resistive plate chamber detector samples were exposed to 60Co gamma source for various irradiation doses. To explore the impact of gamma irradiation induced structural modifications, Positron annihilation lifetime, Fourier transform infrared spectroscopic and X-ray diffraction (XRD) studies were performed. The increased free volume (Vf) for lower irradiation doses is attributed to the scission of polymeric chains. The free volume parameters are in good agreement with XRD and conductivity results. The ac conductivity varies linearly with the applied frequency and obey Jonscher power law. The conduction mechanism is explained on the basis of barrier hopping model.

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Acknowledgement

The authors are indebted to Govt. of India for endorsing INO-DST science project to the University of Mysore [No: SR/MF/PS-02/2013 MU], Mysore, India. We are also thankful to the INO-collaboration for their continuous support and encouragement in fulfilling this research work.

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All authors are contributed to the study, conception and design of this manuscript. Sample collection, gamma irradiation, data collection and analysis were performed by KVAK, MR and VNH. The interpretation of the results and manuscript preparation was done by KVAK and HBR with the help of Professor APGP. The final manuscript was read and approved by all authors.

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Correspondence to H. B. Ravikumar.

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Kumar, K.V.A., Raghavendra, M., Hegde, V.N. et al. Gamma irradiation induced microstructural modification and electrical conductivity of bakelite resistive plate chamber material. J Radioanal Nucl Chem 327, 821–829 (2021). https://doi.org/10.1007/s10967-020-07565-z

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  • DOI: https://doi.org/10.1007/s10967-020-07565-z

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