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Peculiarities of Intermetallic Phase Formation in the Process of a Solid State Reaction in (Al/Cu)n Multilayer Thin Films

  • Advanced Coating and Thin Film Materials for Energy, Aerospace and Biological Applications
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A Correction to this article was published on 30 March 2021

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Abstract

Phase formation in a solid state reaction in Al/Cu bilayer and multilayer thin films was studied by the methods of in situ transmission electron microscopy, electron diffraction, simultaneous thermal analysis and x-ray diffraction. It was established that the phase formation sequences in the (Al/Cu)n (n = 2, 15) multilayer thin films (θ-Al2Cu → γ1-Al4Cu9 → η2-AlCu) and Al/Cu bilayer thin films (θ-Al2Cu → η2-AlCu → γ1-Al4Cu9) were different. It was assumed that the phase formation process in the thin films was strongly affected by a number of copper/aluminum interfaces due to the changes of aluminum and copper diffusion current.

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Acknowledgements

This work was supported by the Russian Science Foundation under Grant #18-13-00080. The electron microscopy investigations were conducted in the SFU Joint Scientific Center whose infrastructure was supported by the State assignment (#FSRZ-2020-0011) of the Ministry of Science and Higher Education of the Russian Federation. The preparation of cross-section samples for TEM investigations was conducted in the Krasnoyarsk Regional Center of Research Equipment of Federal Research Center “Krasnoyarsk Science Center SB RAS”.

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Authors and Affiliations

  1. Siberian Federal University, 79 Svobodny pr., Krasnoyarsk, Russia, 660041

    Evgeny T. Moiseenko, Sergey M. Zharkov, Roman R. Altunin, Oleg V. Belousov & Galina M. Zeer

  2. Kirensky Institute of Physics, Federal Research Center KSC SB RAS, Akademgorodok 50/38, Krasnoyarsk, Russia, 660036

    Sergey M. Zharkov & Mikhail N. Volochaev

  3. Institute of Chemistry and Chemical Technology, Federal Research Center KSC SB RAS, Akademgorodok 50/24, Krasnoyarsk, Russia, 660036

    Oleg V. Belousov, Leonid A. Solovyov & Vladimir V. Yumashev

  4. Reshetnev Siberian State University of Science and Technology, Krasnoyarskij Rabochij 31, Krasnoyarsk, Russia, 660037

    Mikhail N. Volochaev

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  1. Evgeny T. Moiseenko
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Moiseenko, E.T., Zharkov, S.M., Altunin, R.R. et al. Peculiarities of Intermetallic Phase Formation in the Process of a Solid State Reaction in (Al/Cu)n Multilayer Thin Films. JOM 73, 580–588 (2021). https://doi.org/10.1007/s11837-020-04522-9

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