Abstract
In this paper, the effect of perforations on both pull-in voltage and S-parameters have been studied experimentally and compared with the simulation results of perforated and non-perforated switch designs for validation. The perforated switch is fabricated using 4-mask layer process and low pull-in voltage of 1.85 V is achieved by introducing novel iterative methodology which reduce spring constant of meanders. The switch shows good insertion loss of − 0.16 dB and isolation of − 54.8 dB at 40 GHz. Due to perforations, the deviation of pull-in voltage is observed from 1.6 V to 1.85 V and also decrement in capacitive area results in frequency shift of 1000 MHz which shows huge effect in operating frequency of RF MEMS switch. The proposed switch can be efficiently used for 5G GSMA applications operating at 40 GHz frequency.
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Acknowledgements
The Authors would like to thank to NMDC supported by NPMASS, National Institute of Technology, Silchar for providing the necessary computational tools. This research (or a portion thereof) was performed using facilities at CeNSE, Indian Institute of Science, Bengaluru, funded by Ministry of Human Resource Development (MHRD), Ministry of Electronics and Information Technology (MeitY), and Nanomission, Department of Science and Technology (DST), Govt. of India..sponsor).
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Kumar, P.A., Rao, K.S. & Sravani, K.G. Effect of perforations on fabricated iterative meandered RF MEMS switch for millimeter wave applications. Microsyst Technol 27, 3611–3616 (2021). https://doi.org/10.1007/s00542-020-05107-x
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DOI: https://doi.org/10.1007/s00542-020-05107-x