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Electrochemical parameters of aluminum oxide film in situ during anodization of aluminum by white light-optical interferometry

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Abstract

Both Fabry–Pérot interferometry and the DC electrochemical method have been simultaneously used for the first time to measure in situ the anodic current density (J) of aluminum oxide films in 0, 2, 4, 5, 6, 8 and 10% sulfuric acid solutions (H2SO4). The calculated values of J by Fabry–Pérot interferometry were verified by the DC electrochemical method, i.e., a potentiostat, and the AC electrochemical method, i.e., a potentiostat with an accessory of AC impedance spectroscopy (EIS). The corresponding thickness (d) of the aluminum oxide (Al2O3) film to the anodic current density was determined by Fabry–Pérot interferometry under a potentiostatic condition of 9 V with respect to the open circuit potential of the aluminum samples in the H2SO4 solutions, for 90 min. Then, the obtained d of the Al2O3 films by Fabry–Pérot interferometry was verified by scanning electron microscopy (SEM) and compared to d values that were obtained by the EIS. The calculated J by Fabry–Pérot interferometry was found to be in agreement with those of the DC electrochemical method. In contrast, the calculated J by Fabry–Pérot interferometry was found to have a threefold discrepancy with data obtained by the EIS.

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Authors and Affiliations

  1. Materials Science and Photo-Electronics Lab, RE Program, EBR Center, KISR, P.O. Box 24885, 13109, Safat, Kuwait

    Khaled Habib

  2. Center of Research in Optoelectronics, Communication and Control System, School of Engineering, Bangkok University, Pathum Thani, 12120, Thailand

    Waleed Mohammad

  3. Center of Excellent in Nanotechnology, School of Engineering and Technology, Asian Institute of Technology, Pathum Thani, 12120, Thailand

    Farzia Karim

  4. Chair of Functional Materials Division at the KTH Royal Institute of Technology, Isafjordsgatan 22, Stockholm, Sweden

    Joydeep Dutta

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  1. Khaled Habib
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  2. Waleed Mohammad
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  3. Farzia Karim
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  4. Joydeep Dutta
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Correspondence to Khaled Habib.

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Habib, K., Mohammad, W., Karim, F. et al. Electrochemical parameters of aluminum oxide film in situ during anodization of aluminum by white light-optical interferometry. Opt Rev 28, 18–26 (2021). https://doi.org/10.1007/s10043-020-00629-1

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  • DOI: https://doi.org/10.1007/s10043-020-00629-1

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