Identifying and mapping chemical bonding within phenolic resin using secondary electron hyperspectral imaging

Nicholas T. H. Farr; Sameer F. Hamad; Euan Gray; Christopher M. Magazzeni; Fodio Longman; David E. J. Armstrong; Joel P. Foreman; Frederik Claeyssens; Nicola H. Green; Cornelia Rodenburg

doi:10.1039/D0PY01220C

Identifying and mapping chemical bonding within phenolic resin using secondary electron hyperspectral imaging†

Nicholas T. H. Farr,

*^ab Sameer F. Hamad,^a Euan Gray,^a Christopher M. Magazzeni,^c Fodio Longman,^a David E. J. Armstrong,^c Joel P. Foreman,^a Frederik Claeyssens,^a Nicola H. Green

^ab and Cornelia Rodenburg

^a

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* Corresponding authors

^a Department of Materials Science and Engineering, Sir Robert Hadfield Building, Mappin Street, University of Sheffield, UK
E-mail: nfarr1@sheffield.ac.uk

^b Insigneo Institute for in Silico Medicine, The Pam Liversidge Building, Sir Robert Hadfield Building, Mappin Street, Sheffield, UK

^c Department of Materials, University of Oxford, Parks Road, Oxford, UK

Abstract

The distributions of methylene and ether bridges have been shown to impact the mechanical properties of phenolic resin. This work demonstrates the ability of the novel SEM based technique, secondary electron hyperspectral imaging (SEHI), to characterise and map methylene and ether bridges within phenolic resin at the nanoscale.

This article is part of the themed collection: Polymer Chemistry Most Popular 2021

Polymer Chemistry

Identifying and mapping chemical bonding within phenolic resin using secondary electron hyperspectral imaging†

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Identifying and mapping chemical bonding within phenolic resin using secondary electron hyperspectral imaging

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