Elsevier

Applied Surface Science

Volume 541, 1 March 2021, 148528
Applied Surface Science

Full Length Article
Properties of Nb3Sn films fabricated by magnetron sputtering from a single target

https://doi.org/10.1016/j.apsusc.2020.148528Get rights and content

Highlights

  • Nb3Sn superconducting films were fabricated by magnetron sputtering from a single target.

  • Effects of annealing temperature and time on film structure and superconducting properties were examined.

  • The highest critical temperature Tc = 17.83 K was observed for the Nb3Sn films annealed at 800 °C for 24 h.

  • Raman study of the films showed high sensitivity to the surface composition.

  • RF surface resistance of Nb3Sn on Nb shows the highest Tc = 17.44 K.

Abstract

Superconducting Nb3Sn films were fabricated on sapphire and fine grain Nb substrates by magnetron sputtering from a single stoichiometric Nb3Sn target. The structural, morphological and superconducting properties of the films annealed for 24 h at temperatures of 800–1000 °C were investigated. The effect of the annealing time at 1000 °C was examined for 1, 12, and 24 h. The film properties were characterized by X-ray diffraction, scanning electron microscopy, atomic force microscopy, energy dispersive X-ray spectroscopy, and Raman spectroscopy. The DC superconducting properties of the films were characterized by a four-point probe measurement down to cryogenic temperatures. The RF surface resistance of films was measured over a temperature range of 6–23 K using a 7.4 GHz sapphire-loaded Nb cavity. As-deposited Nb3Sn films on sapphire had a superconducting critical temperature of 17.21 K, which improved to 17.83 K when the film was annealed at 800 °C for 24 h. For the films annealed at 1000 °C, the surface Sn content was reduced to ~11.3% for an annealing time of 12 h and to ~4.1% for an annealing time of 24 h. The Raman spectra of the films confirmed the microstructural evolution after annealing. The RF superconducting critical temperature of the as-deposited Nb3Sn films on Nb was 16.02 K, which increased to 17.44 K when the film was annealed at 800 °C for 24 h.

Introduction

Nb3Sn is of interest as a coating for superconducting radiofrequency (SRF) cavities due to its higher critical temperature Tc of ~18.3 K and superheating field Hsh of ~400 mT [1]. Nb3Sn cavities have the potential to achieve high quality factor Q0 when operated at 4 K and can replace the bulk Nb cavities that are operated at 2 K [2], [3]. The higher operating temperature of Nb3Sn cavities compared to Nb can significantly reduce the operating cost. However, Nb3Sn cannot be used as bulk material due to its fragile nature and poor thermal conductivity. Nb3Sn thin films coated on niobium or copper are considered as potential alternative materials for SRF cavities [2], [3]. A 1.3 GHz single-cell Nb3Sn/Nb cavity fabricated by Sn vapor diffusion at Jefferson Lab have demonstrated a Q0 ≥ 2 × 1010 at 4 K before quenching at a field ≥15 MV/m [4], while Nb3Sn/Nb CEBAF five-cell cavities had a low-field Q0 of ~3 × 1010 [5] and maximum accelerating gradient up to 15 MV/m at 4 K [6]. An accelerating gradient of 22.5 MV/m at 4 K was achieved at Fermilab for a 1.3 GHz single-cell cavity [7]. At Cornell University, Nb3Sn-coated 2.6 GHz cavities had a quality factor of 8 × 109 at 4 K, which is 50 times higher than that of 2.6 GHz Nb cavities at 4 K, and preliminary data on Nb3Sn-coated 3.9 GHz cavities showed a low field Q0 of ~2 × 109 at 4.2 K [8]. Nb3Sn films on sapphire substrates also have potential applications for superconducting microwave devices [9].

Magnetron sputtering has been used to grow Nb3Sn films from a single stoichiometric Nb3Sn target [10], [11], [12], [13], using separate Nb and Sn targets to deposit multilayers that are thermally interdiffused [14], [15], [16], or co-sputtering of Nb and Sn [17]. Early successful fabrication of Nb3Sn films by magnetron sputtering from a stoichiometric target was performed at Argonne National Lab [10], [11]. There, Nb3Sn films were grown on sapphire and the superconducting properties were examined for films grown at various sputter argon background pressures of 5–50 mTorr and substrate temperatures of 600–800 °C. The reported Tc and critical current density Jc of the grown films were up to 18.3 K and 15 × 106 A/cm2, respectively [11]. Nb3Sn films sputtered from a single phase Nb3Sn target on MgO substrates had a Tc of 15.3 K after annealing at 900 °C for 1 h [12]. The formation of Nb3Sn by the reactive interdiffusion of Nb/Sn multilayers on oxidized Si and sapphire at high temperatures was investigated at AT&T Bell Laboratories [14]. The experiments of Nb/Sn multilayers on oxidized Si and sapphire showed that, Nb6Sn5 phase was present during the growth of A15 Nb3Sn. The Nb6Sn5 phase disappeared above 800 °C. In this study, the highest Tc of 17.45 K was observed for films annealed at 850 °C. Nb3Sn sputtered on copper [13], [18], [19] and Nb [20], [21] substrates were studied for its application in SRF cavities. For Nb3Sn deposited on copper, the annealing temperature was limited to 830 °C due to a lower melting point of copper and the mismatch between the thermal expansion coefficients of copper and Nb3Sn [13]. Niobium has a high melting point and a thermal expansion coefficient close to that of Nb3Sn [22]. Therefore, the deposition of Nb3Sn on Nb and annealing of the grown film can be performed at temperatures above 830 °C. Nb3Sn films grown by magnetron sputtering on different substrates have shown DC superconducting Tc of up to 15.7 K for copper [18], 17.7 K for niobium [21], and 17.93 K for sapphire substrates [23]. For SRF cavity applications, the RF properties of Nb3Sn films are of interest. The RF properties of magnetron sputtered Nb3Sn films on sapphire [24], [25] and copper substrates [26] were reported previously.

We present the impact of annealing temperatures over the temperature range of 800–1000 °C on the material, DC, and RF superconducting properties of Nb3Sn films grown on sapphire and Nb by magnetron sputtering from a single stoichiometric Nb3Sn target. The changes in film structure, morphology, and chemical composition due to different annealing conditions on different substrates is compared with the DC and RF superconducting properties of the films. We established the growth conditions to produce Nb3Sn films with high Tc and very sharp superconducting transitions on sapphire substrates and applied the conditions to grow Nb3Sn films on niobium substrates. The RF surface resistance of the Nb3Sn films sputtered on Nb was then characterized with a 7.4 GHz sapphire-loaded Nb cavity.

Section snippets

Experimental details

Nb3Sn was deposited on sapphire and Nb substrates by DC magnetron sputtering from a stoichiometric Nb3Sn disk target of 2 in. diameter and 0.25 in. thickness (Kurt J. Lesker EJTNBSN302A4, 99.9% purity). The substrates were 430 μm thick double-side polished sapphire with C-M orientation (University Wafers Inc. part # 1251). The substrates were cleaned with ethanol and isopropanol and dried with N2 gas flow before loading in the deposition chamber. The 1 cm × 1 cm Nb substrates were cut from a Nb

Film structure, morphology, and composition

Fig. 1 shows the XRD patterns of the as-deposited film and films annealed at different temperatures for 24 h. As-deposited films showed both Nb and Nb3Sn diffraction peaks. The Nb peaks disappeared when the film was annealed at 800 and 900 °C. However, a few Nb peaks reappeared when the film was annealed at 1000 °C for 24 h. For films annealed at 800 and 900 °C, the Nb3Sn peak intensity became stronger, indicating better crystallinity. At an annealing temperature of 1000 °C, potential Sn

Conclusion

We fabricated Nb3Sn films on sapphire and Nb substrates by DC magnetron sputtering from a stoichiometric target. The films were post-annealed at different temperatures for different durations. The as-deposited film had polycrystalline Nb3Sn and the crystallinity of the film improved when annealed at 800 °C for 24 h. The film quality degraded when annealed at 1000 °C for 12 and 24 h due to Sn evaporation from the surface. The highest Tc = 17.83 K was obtained from the film annealed at 800 °C for

CRediT authorship contribution statement

Md. Nizam Sayeed: Methodology, Investigation, Writing - original draft. Uttar Pudasaini: Formal analysis, Writing- review & editing. Charles E. Reece: Supervision, Writing- review & editing. Grigory V. Eremeev: Supervision, Writing- review & editing. Hani E. Elsayed-Ali: Supervision, Writing- review & editing.

Declaration of Competing Interest

The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

Acknowledgement

This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Nuclear Physics under U.S. DOE Contract No. DE-AC05-06OR23177. Some of the characterizations are performed at the Applied Research Center Core Labs at The College of William and Mary. The authors would like to thank Dr. Gianluigi Ciovati for his comments. The authors acknowledge Peter Owen and Pete Kushnick of Jefferson Lab for their continuous help on RF surface resistance measurement and

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