Abstract
We have prepared the anode cell of an X-ray lithograph in the form of a PolySi/Si3N4/SiO2 membrane structure using group technology. The design of the stand for determining mechanical properties of membranes has been modernized. The critical pressure of a membrane structure with a diameter 250 μm varies in the range from 0.484 to 0.56 MPa for 15 samples. The mechanical strength of the PolySi*/Si3N4/SiO2 structure is 3.13 GPa. The new model in the Comsol package shows good correlation between the experimental critical pressure and the theoretical mechanical strength of the membrane. The distribution of mechanical stresses over the membrane has been obtained by simulation and analytic calculation. It is proved that the structure breaking region is localized at the membrane/substrate interface.
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REFERENCES
N. A. Dyuzhev, G. D. Demin, A. E. Pestov, N. N. Salashchenko, and N. I. Chkhalo, Microelectronics-2019, p. 429.
B. Wu and A. Kumar, Appl. Phys. Rev. 1 (1), 011104 (2014). https://doi.org/10.1063/1.4863412
N. I. Chkhalo, A. Ya. Lopatin, A. E. Pestov, N. N. Malashchenko, G. D. Demin, N. A. Dyuzhev, and M. A. Makhiboroda, Proc. SPIE 11022, 110221M (2019). https://doi.org/10.1117/12.2522105
V. V. Shpejzman, V. I. Nikolaev, A. O. Pozdnyakov, A. V. Bobyl’, R. B. Timashov, and A. I. Averkin, Tech. Phys. 90 (1), 79 (2020). https://doi.org/10.21883/JTF.2020.01.48665.148-19]
E. E. Gusev, A. V. Borisova, A. A. Dedkova, A. A. Salnikov, and V. Y. Kireev, IEEE Conf. of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) (St. Petersburg–Moscow, Russia, January 28–31, 2019), No. 8657243, pp. 1990–1994. https://doi.org/10.1109/eiconrus.2019.8657243
A. S. Savinykh, G. I. Kanel, and S. V. Razorenov, Tech. Phys. 55 (6), 839 (2010). https://doi.org/10.1134/S1063784210060150
Yu. V. Zhilyaev, S. D. Raevskii, D. Z. Grabko, D. S. Leu, M. E. Kompan, S. A. Yusupova, and M. P. Shcheglov, Tech. Phys. Lett. 31 (5), 367 (2005). https://doi.org/10.1134/1.1931770
A. I. Vlasov, T.A. Tsivinskaya, and V.A. Shakhnov, Proc. 7th All-Russia Sci. & Technol. Conf. “Problems of Advanced Micro- and Nanoelectronic Systems Development” (MES-2016) (Zelenograd, Russia, October 3–7, 2016). http://www.mes-conference.ru/data/year2016/pdf/D084.pdf.
S. L. Shikunov and V. N. Kurlov, Tech. Phys. 62 (12), 1869 (2017). https://doi.org/10.1134/S1063784217120222
M. G. Mueller, M. Fornabaio, G. Zagar, and A. Mortensen, Acta Mater. 105, 165 (2016). https://doi.org/10.1016/j.actamat.2015.12.006
R. Venkatraman and J. C. Bravman, J. Mater. Res. 7 (8), 2040 (1992). https://doi.org/10.1557/JMR.1992.2040
T. Tsuchiya, A. Inoue, and J. Sakata, Sens. Actuators, A 82 (1–3), 286 (2000). https://doi.org/10.1016/S0924-4247(99)00363-5
W. N. Sharpe, J. Pulskamp, D. S. Gianola, C. Eberl, R.G. Polcawich, and R. J. Thompson, Exp. Mech. 47, 649 (2007). https://doi.org/10.1007/s11340-006-9010-z
Jinling Yang, A. Gaspar, and O. Paul, J. Microelectromech. Syst. 17 (5), 1120 (2008). https://doi.org/10.1109/JMEMS.2008.928706
K. Petersen, Proc. IEEE 70 (5), 420 (1982).
Tai-Ran Hsu, MEMS and Microsystems: Design and Manufacture (McGraw-Hill Education, Boston, 2002).
M. Madou, Fundamentals of Microfabrication (Taylor & Francis, London, 1997).
Qing An Huang, Micro Electro Mechanical Systems (Springer, Singapore, 2018).
R. L. Edwards, G. Coles, and W. N. Sharpe, Exp. Mech. 44 (1), 49 (2004). https://doi.org/10.1007/bf02427976
T. Tsuchiya, J. Sakata, and Y. Taga, MRS Online Proc. Libr. 505, 285 (1998). https://doi.org/10.1557/proc-505-285
T. Ozaki, T. Koga, N. Fujitsuka, H. Makino, H. Hohjo, and H. Kadoura, Sens. Actuators, A 278, 48 (2018). https://doi.org/10.1016/j.sna.2018.05.034
R. Vayrette, J.-P. Raskin, and T. Pardoen, Eng. Fract. Mech. 150, 222 (2015).
B. L. Boyce, J. M. Grazier, T. E. Buchheit, and M. J. Shaw, J. Microelectromech. Syst. 16 (2), 179 (2007).
B. Kaiser, C. Drabe, T. Graßhoff, H. Conrad, and H. Schenk, J. Micromech. Microeng. 25 (8), 085003 (2015). https://doi.org/10.1088/0960-1317/25/8/085003
W. N. Sharpe and J. Bagdahn, Mech. Mater. 36 (1–2), 3 (2004). https://doi.org/10.1016/s0167-6636(03)00027-9
W. N. Sharpe and K. T. Turner, Proc.7th Int. Fatigue Congr. (Fatigue’99), Beijing, China, June 8–12,1999 (Higher Education, Beijing, 1999), pp. 1837–1844.
Funding
The research work was performed on the equipment of the Microsystem Technology and Electronic Component Base Center for Collective Use of National Research University “MIET” with the support of the Ministry of Education and Science of the Russian Federation, state contract no. 14.581.21.0021, UN RFMEFI58117X0021.
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Djuzhev, N.A., Gusev, E.E., Dedkova, A.A. et al. Experimental Determination of Mechanical Properties of the Anode Cell of an X-Ray Lithograph. Tech. Phys. 65, 1755–1759 (2020). https://doi.org/10.1134/S1063784220110055
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DOI: https://doi.org/10.1134/S1063784220110055