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Reflectance imaging spectroscopy in heritage science

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La Rivista del Nuovo Cimento Aims and scope

Abstract

The present paper focuses on the reflectance spectral imaging of painted surfaces in the visible-near infrared spectral region (400–2500 nm). Other spectral ranges and methods are mentioned, to contextualize the spectral investigation of works of art.

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Abbreviations

\(\mu \)XRF:

Micro-X-Ray Fluorescence

2D:

Two-dimensional

3D:

Three-dimensional

ANN:

Artificial neural network

APD:

Avalanche photodiode

B :

Blue

BR-RIS :

Broad spectral range reflectance imaging spectroscopy

CCD :

Charge-coupled device

EDS :

Energy dispersive spectroscopy

EMCCD :

Electron-multiplying CCD

FORS :

Fiber optics reflectance spectroscopy

FOV :

Field of view

FPA :

Focal plane array

FT:

Fourier transform

FT-IR :

Fourier transform infrared

FWHM:

Full width at half maximum

G:

Green

HS :

Hyperspectral

HS-RIS :

Hyperspectral reflectance imaging spectroscopy

HSI:

Hyperspectral imaging

ICCD:

intensified CCD

InGaAs :

Indium gallium arsenide

IRR:

Infrared reflectography

IS:

Imaging spectroscopy

LWIR:

Longwave infrared

MA-XRF :

Macro X-Ray fluorescence

MA-XRF-SR:

Synchrotron-based macro X-ray fluorescence

MB :

Multiband

MCD:

Multi-channel detector

MCT:

Mercury cadmium telluride

MNF:

Minimum noise factor transform

MS :

Multispectral

MS-RIS:

Multispectral reflectance imaging spectroscopy

MSI :

Multispectral imaging

MWIR :

Midwave infrared

NG :

National Gallery

NIR:

Near infrared

OCT:

Optical coherence tomography

OPD:

Optical path difference

PAI:

Photoacoustic imaging

PCA:

Principle component analysis

PD :

Photodiode

PLM:

Polarized light microscopy

PMT:

Photomultiplier tube

R :

Red

RF :

Radio frequency

RIS:

Reflectance imaging spectroscopy

RTI:

Reflectance transformation imaging

SCD:

Single-channel detector

SAM:

Spectral angle mapper

SCM:

Spectral correlation mapping

sCMOS:

Scientific complementary metal–oxide semiconductor

SEM:

Scanning electron microscopy

SMACC:

Sequential maximum-angle convex cone

SNR:

Signal to noise ratio

SR-XRF:

Synchrotron radiation X-Ray fluorescence

SWIR:

Shortwave infrared

THz-TDS:

Terahertz time-domain spectroscopy

US:

Ultrasound

UVVISNIR:

Ultraviolet, visible and near-infrared

VIS:

Visible

XFM:

X-Ray fluorescence microscopy

XRF:

X-Ray fluorescence

XRR:

X-ray radiography

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    J. Striova, A. Dal Fovo & R. Fontana

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Striova, J., Dal Fovo, A. & Fontana, R. Reflectance imaging spectroscopy in heritage science. Riv. Nuovo Cim. 43, 515–566 (2020). https://doi.org/10.1007/s40766-020-00011-6

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