• Open Access

Combined influence of beamstrahlung and coupling impedance on beam energy spread and length in future lepton colliders

D. Leshenok, S. Nikitin, Y. Zhang, and M. Zobov
Phys. Rev. Accel. Beams 23, 101003 – Published 27 October 2020
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Abstract
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  • INTRODUCTION
  • ENERGY LOSS DUE TO BS
  • BEAM ENERGY SPREAD AND LENGTH DUE TO BS
  • COMBINED MODEL WITH BUNCH LENGTHENING
  • NUMERICAL SIMULATION
  • COMPARISON OF RESULTS
  • CONCLUSIONS
  • ACKNOWLEDGMENTS
    • References

    Abstract

    A semianalytical model has been developed to study a combined effect of beamstrahlung due to beam-beam interaction and beam coupling impedance in the future lepton colliders CEPC and FCC-ee. This model allows evaluating an impact of the coupling impedance on the bunch length and energy spread in collision. The model is benchmarked against numerical simulations. Analytical estimates for the supercolliders are presented.

    • Figure
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    • Received 20 July 2020
    • Accepted 30 September 2020

    DOI:https://doi.org/10.1103/PhysRevAccelBeams.23.101003

    Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

    Published by the American Physical Society

    Physics Subject Headings (PhySH)

    1. Research Areas
    Beam code development & simulation techniquesBeam dynamicsBeam impedanceBeam processesElectromagnetic field calculations
    Accelerators & Beams

    Authors & Affiliations

    D. Leshenok* and S. Nikitin†

    • Budker Institute of Nuclear Physics, 630090 Novosibirsk, Russia

    Y. Zhang‡

    • IHEP, 19B Yuquan Road, Shijingshan District, Beijing 100049, China

    M. Zobov§

    • INFN, Laboratori Nazionali di Frascati, via Enrico Fermi 40, 00044 Frascati, RM, Italy

    • *dariya210612@gmail.com
    • †nikitins@inp.nsk.su
    • ‡zhangy@ihep.ac.cn
    • §Mikhail.Zobov@lnf.infn.it

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    References

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    Issue

    Vol. 23, Iss. 10 — October 2020

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