Structural, optical and electrical transport properties of Sn doped In2O3
Graphical abstract
Introduction
Indium oxide (In2O3), also well known as transparent semiconducting oxide (TSO) has been widely studied as semiconductor material for many years and most of the scientific endeavours have been pointed towards its widespread use in optoelectronic applications [1, 2]. It has excellent electrical and optical properties since it is transparent ( 85-90 %) in the visible region due to its wide band gap (Eg = 3.5-4.0 eV) at room temperature (RT) along with very low electrical resistivity (ρ 10-4 -cm) [3, 4].
Tin doped indium oxide (ITO) is the most prominent among the transparent conducting oxide (TCO) and is an industrial standard material. Among many TCO material ITO only, is an advanced semiconducting material due to its benchmark electrical conductivity and high optical transparency with potential optoelectronic applications like touch screens, touch panel contacts, electro-chromic displays, electrodes for LCD, gas sensor and anti fogging aircraft windows [5, 6, 7, 8]. Different forms of ITO powder with low dimension and large surface area such as nanocrystalline materials [5], nanoparticles [9], nanorods [6] and nanowires [10] have been good technological interest for electronic devices whereas very few researchers had published their research on the bulk and nanocrystalline powder. However, stable cubic bixbyite phase of ITO nanocrystalline material is only attributed to high electrical conductivity. Again, the electrical behavior of ITO nanocrystalline material especially at low temperatures and amazingly the insulator to metal transitions still makes a scope for further researchers to study and know the low temperature behavior of these materials [11, 12].
It is noticed from the above context that the most of the researchers extensively focused on thin films and different nanostructures of Sn doped In2O3 but very few articles have been reported on the nanocrystalline powder and bulk to use in optoelectronic applications. In this perspective, our motivation in accomplishing this study was to synthesize In2-xSnxO3 (0.0 x 0.25) nanocrystalline material using simple solid state reaction method with multiple calcination and sintering process at high temperature. Henceforth, the structural, morphological, optical and electrical transport properties of this system are well investigated. The insulator to metal transition are determined from temperature dependent four probe resistivity measurement.
Section snippets
Experiments
Nanocrystalline powders for the compositions In2-xSnxO3 (x = 0.0, 0.05, 0.1, 0.15, 0.2, and 0.25) were successfully prepared by solid state reaction method. In2O3 and SnO2 (Sigma-Aldrich, 99.999% pure) powders were mixed in required stoichiometry and grounded for 6 h with acetone in mortar and pestle, then calcined at 900oC for 11 h. After calcination, the samples were regrinded for 6 h for proper mixing and again calcined at 900oC for 8 h. The resultant samples were again grinded for 2 h to
Structural and Morphological properties
The Rietveld fitted XRD patterns of In2-xSnxO3 (x = 0.0-0.25) powder samples are well represented in Fig. 1. It is observed that the crystal structure of all synthesized samples fits in cubic bixbyite geometry of pure In2O3 with I a -3 (206) space group and also coordinated with card number 76-0152 (ICDD-JCPDS), in which every unit cell contains eight formula units of In2O3. The bixbyite structure of In2O3 contains 80 atoms in a conventional cell and 40 atoms in a primitive unit cell. In2O3 has
Conclusion
In summary, Sn substitution in In2-xSnxO3 (x = 0.0-0.25) nanocrystalline samples cause systematic structural changes in a and V along with bond lengths of In0-O2/Sn0-O2 & In1-O2/Sn1-O2. The crystallite sizes of all samples, calculated by using Debye-Scherrer formula are comparable with the results obtained from Williamson-Hall method, also support the results observed from TEM whereas the particle sizes are found to be 81.72 nm and 79.17 nm for x = 0.1 and 0.2 respectively. Rietveld refined XRD
Credit author statement
Afroz Khan: Writing - original draft, Data curation, Investigation, Formal analysis. F. Rahman: Supervision. Razia Nongjai: writing - review & editing. K. Asokan: Resources.
Declaration of competing interest
The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.
Acknowledgment
The authors thank to IUAC, New Delhi for providing the financial support with research project (Project Code: UFR-61305). AK acknowledges Ram Charan Meena and Ambuj Mishra, IUAC, New Delhi for their help during transport and TEM/HRTEM/SAED measurements, respectively. AK wants special thank to Saif A. Khan, IUAC, New Delhi for providing SEM and EDX facilities. V. Sathe from UGC-DAE, CSR, Indore are also thanked for arranging the Raman facility.
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