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Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components

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Abstract

Reliability is the most important qualitative properties of products and industrial electronic systems. Today, industrial electronic systems need to produce products with maximum reliability. In every industry, when a system fails, it becomes harmful in various aspects such as economic, human and political; therefore, accurate estimation of system reliability is very important. Previous methods to calculate system reliability assumed that a large number of components failures are statistically independent. Considering such a hypothesis makes it possible to calculate probability and mathematical computation, but it does not provide perfect system reliability. This paper presents a simple and new technique for reliability analysis by considering unequal reliability and non-identical distribution of correlated components for k-out-of-n and coherent systems. The efficiency of our proposed method is demonstrated by computing the reliability of Bridge system. The results show that the function of existing components correlation has a major impact, and that ignoring it has a significant effect on system safety.

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Correspondence to Roya M. Ahari.

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Appendix 1: Proof of Eqs. (5), (6) and (7)

Appendix 1: Proof of Eqs. (5), (6) and (7)

Consider steps 1 through 4 to prove Eqs. (5), (6) and (7)

$$ E\left({X}_i\right)=E\Big\{{I}_{\left\{0\right\}}\left\{{Y}_i\left({\lambda}_i-{\lambda}_{i,j}\right)+{Y}_{i,j}\left({\lambda}_{i,j}\right)\right\}=\mathit{\Pr}\left\{Y{\left({\lambda}_i-{\lambda}_{i,j}\right)}_i=0\right\}\mathit{\Pr}\left\{{Y}_{i,j}\left({\lambda}_{i,j}\right)=0\right\}={e}^{-\left({\lambda}_i-{\lambda}_{i,j}\right)}{e}^{-{\lambda}_{i,j}}={e}^{-{\lambda}_i}={R}_i. $$
$$ E\left({X}_i{X}_j\right)=\mathit{\Pr}\left({Y}_i\left({\lambda}_i-{\lambda}_{i,j}\right)=0\&{Y}_j\left({\lambda}_j-{\lambda}_{i,j}\right)\&{Y}_{i,j}\left({\lambda}_{i,j}\right)=0\right)={e}^{-\left({\lambda}_i-{\lambda}_{i,j}\right)}.{e}^{-\left({\lambda}_j-{\lambda}_{i,j}\right)}{e}^{-{\lambda}_{i,j}}={e}^{-\left({\lambda}_i-{\lambda}_{i,j}\right)}.{e}^{-\left({\lambda}_j-{\lambda}_{i,j}\right)}{e}^{-{\lambda}_{i,j}}={R}_i.{R}_j.{e}^{\lambda_{i,j}} $$
$$ \mathit{\operatorname{var}}\left({X}_i\right)=E\left({X_i}^2\right)-{E}^2\left({X}_i\right)=\mathit{\Pr}\left({X}_i=1\right)-{R^2}_i={R}_i\left(1-{R}_i\right) $$

Therefore:

$$ \mathit{\Pr}\left({X}_i=1\&{X}_j=1\left)=\mathit{\Pr}\right({Y}_i\left({\lambda}_i-{\lambda}_{i,j}\right)+{Y}_{i,j}\left({\lambda}_{i,j}\right)=0\&{Y}_j\left({\lambda}_j-{\lambda}_{i,j}\right)+{Y}_{i,j}\left({\lambda}_{i,j}\right)=0=\mathit{\Pr}\left({Y}_i\left({\lambda}_i-{\lambda}_{i,j}\right)=0\&{Y}_j\left({\lambda}_j-{\lambda}_{i,j}\right)\&{Y}_{i,j}\left({\lambda}_{i,j}\right)=0\right)={e}^{-\left({\lambda}_i-{\lambda}_{i,j}\right)}.{e}^{-\left({\lambda}_j-{\lambda}_{i,j}\right)}{e}^{-{\lambda}_{i,j}}={R}_i{R}_j\left(1+{\rho}_{i,j}\sqrt{\frac{\left(1-{R}_i\right)\left(1-{R}_j\right)}{R_i.{R}_j}}\right)\right) $$

1.1 Appendix 2: Proof of Eq. (21)

The following relation is used to prove this equation:

$$ \Pr \left({E}_1\cup {E}_2\cup \dots \cup {E}_n\right)=\sum \limits_{i=1}^nP\left({E}_i\right)-\sum \limits_{i_1<{i}_2}P\left({E}_{i_1}\cap {E}_{i_2}\right)+\dots +{\left(-1\right)}^{r+1}\sum \limits_{i_1<{i}_2<\dots <{i}_r}P\left({E}_{i_1}\cap {E}_{i_2}\cap \dots \cap {E}_{i_r}\right)+\dots +{\left(-1\right)}^{n+1}P\left({E}_{i_1}\cap {E}_{i_2}\cap \dots \cap {E}_{i_n}\right) $$

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Banitaba, S.M., Ahari, R.M. & Karbasian, M. Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components. J Electron Test 36, 9–21 (2020). https://doi.org/10.1007/s10836-019-05853-5

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