Electrical Control for Extending the Ramsey Spin Coherence Time of Ion-Implanted Nitrogen-Vacancy Centers in Diamond

S. Kobayashi, Y. Matsuzaki, H. Morishita, S. Miwa, Y. Suzuki, M. Fujiwara, and N. Mizuochi

Phys. Rev. Applied 14, 044033 – Published 19 October 2020

Abstract

The extension of spin coherence times is a crucial issue for quantum information and quantum sensing. In solid-state systems, suppressing noise through various techniques has been demonstrated. On the other hand, an electrical control for suppression is important toward individual controls of on-chip quantum-information devices. Here, we show electrical control for extension of the spin coherence times of 40-nm-deep ion-implanted single-nitrogen-vacancy center spins in diamond by suppressing magnetic noise. We apply 120 V dc across two contacts spaced by 10 μm. The spin coherence times, estimated from a free-induction decay and a Hahn-echo decay, are increased up to about 10 times (reaching 10 μs) and 1.4 times (reaching 150 μs), respectively. From the quantitative analysis, the dominant decoherence source, depending on the applied static electric field, is elucidated. Electrical control for extension can deliver a sensitivity enhancement to the dc sensing of temperature, pressure, and electric (but not magnetic) fields, opening up an alternative technique in solid-state quantum-information devices.

Received 29 May 2020
Revised 1 September 2020
Accepted 15 September 2020

DOI:https://doi.org/10.1103/PhysRevApplied.14.044033

Physics Subject Headings (PhySH)

Noise Quantum control Quantum information with solid state qubits Quantum memories Quantum sensing Spin coherence

Nitrogen vacancy centers in diamond

Optically detected magnetic resonance

Quantum Information, Science & TechnologyCondensed Matter, Materials & Applied Physics

Authors & Affiliations

S. Kobayashi^1,2, Y. Matsuzaki³, H. Morishita ², S. Miwa ^1,4,5, Y. Suzuki^1,4, M. Fujiwara², and N. Mizuochi ^2,4,*

¹Graduate School of Engineering Science, Osaka University, Toyonaka, Osaka 560-8531, Japan
²Institute for Chemical Research, Kyoto University, Uji, Kyoto 610-0011, Japan
³Device Technology Research Institute, National institute of Advanced Industrial Science and Technology (AIST), Central2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan
⁴Center for Spintronics Research Network (CSRN), Osaka University, Toyonaka, Osaka 560-8531, Japan
⁵The Institute for Solid State Physics, The University of Tokyo, Kashiwa, Chiba 277-8581, Japan

^*mizuochi@scl.kyoto-u.ac.jp

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Vol. 14, Iss. 4 — October 2020

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Images

Figure 1
(a) Schematic image of the measurement setup. (b) Current-voltage property between the electrodes on the sample. Linear I-V property is observed. (c) Distribution of the electric field strength with 100 V between the electrodes. Dots marked as N-V1, N-V2, and N-V3 indicate the positions of the N-V centers of N-V1, N-V2, and N-V3, respectively. (d) Coordinate system of the N-V centers. (e) Schematic images of the directions of N-V axes. N-V axes of N-V1, N-V2, and N-V3 are parallel to one of the following axes: $[\bar{1} \bar{1} 1]$ , $[111]$ , $[11 \bar{1}]$ , or $[\bar{1} \bar{1} \bar{1}]$ .
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Figure 2
(a) ODMR spectra under various electric fields. Plots represent the experimental results of N-V1. Solid lines represent the fitted curves using six Gaussian functions. (b) Electric field dependence of the resonance frequencies. Plots represent the estimated resonance frequencies from the experimental results of N-V1. Solid lines represent the fitted curves calculated from the spin Hamiltonian of the ground-state electron, Eq. (1), with the hyperfine interaction and quadrupole interaction of ¹⁴ $N$ , Eq. (2).
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Figure 3
(a) Ramsey pulse sequence to measure $T_{2}^{FID}$ . (b) Decay curves of the free-induction decay of N-V1. Fit function of $f^{FID} (τ) = y_{0} + A exp[- (τ / T_{2}^{FID})^{2}]$ is employed. In 0 kV/cm, two data are represented as circles and pluses. (c) Electric field dependence of $T_{2}^{FID}$ . Horizontal axis, which represents the electric field strength, is normalized by the magnetic field along the z axis. Dashed curve represents the fitted curve for N-V1. Chained curve represents the fitted curve for N-V2.
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Figure 4
(a) Hahn-echo pulse sequence to measure $T_{2}^{echo}$ . (b) Decay curves of the Hahn-echo signal of N-V1. Fit function of $f^{echo} (2 τ) = y_{0} + A exp[- (2 τ / T_{2}^{echo})^{3}]$ is employed. (c) Electric field dependence of $T_{2}^{echo}$ . Horizontal axis, which represents the electric field strength, is normalized by the magnetic field. Dashed curve represents the fitting curve with magnetic field fluctuation only. Solid curve represents the fitting curve with magnetic and electric field fluctuations.
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Figure 5
(a) ODMR spectra under various electric fields. Plots represent the experimental results of N-V4. (b) Electric field dependence of the resonance frequencies. Plots represent the estimated resonance frequencies from the experimental results of N-V4.
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Figure 6
(a) Decay curves of the free-induction decay of N-V2. Fit function of $f^{FID} (τ) = y_{0} + A exp[- (τ / T_{2}^{FID})^{2}]$ is employed. (b) Decay curves of the free-induction decay of N-V3. Fit function of $f^{FID} (τ) = y_{0} + A exp[- (τ / T_{2}^{FID})^{2}]$ is employed.
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