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Thermal Stability and Hardness Studies of Ge Doped Se–Te Glassy Alloys

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Abstract—

The amorphous glassy alloys Se82 – xTe18Gex (x = 0, 4, 8, 12, at %) was synthesized using melt quench technique. Thermal stability was examined with the help of various parameters such as Dietzal parameter, Hruby parameter, Saad and Poulin and Lu and Liu parameters. Vicker hardness was obtained from Vicker hardness tester and other related thermo-mechanical properties such as volume of micro-voids, energy formation of micro-voids and modulus of elasticity were calculated.

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ACKNOWLEGDMENTS

Authors are thankful to Prof. N. P. Gurao, Prof. Gouthamaand Prof. K. Balani, ACMS, Indian Institute of Technology, Kanpur, India for providing the facilities for XRD, SEM and hardness measurements.

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Authors and Affiliations

  1. Amorphous Semiconductor Research Lab Department of Applied Science, M. M. M. University of Technology, 273010, Gorakhpur, India

    Vandita Rao, Pravin Kumar Singh & D. K. Dwivedi

  2. Department of Electronics and Communication Engineering M. M. M. University of Technology, 273010, Gorakhpur, India

    Pooja Lohia

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  1. Vandita Rao
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  2. Pravin Kumar Singh
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  4. D. K. Dwivedi
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Correspondence to D. K. Dwivedi.

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Vandita Rao, Singh, P.K., Lohia, P. et al. Thermal Stability and Hardness Studies of Ge Doped Se–Te Glassy Alloys. Glass Phys Chem 45, 459–466 (2019). https://doi.org/10.1134/S1087659619060178

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  • DOI: https://doi.org/10.1134/S1087659619060178

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